Probe for electrical connection apparatus
AssigneeKabushiki Kaisha Nihon Micronics
InventorsToshinaga TAKEYA, Yasutaka KISHI
Life of this patent
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Abstract
A probe for an electrical connection apparatus includes: a foot portion having an elongated shape extending in a first direction, and having a joint portion that joins to a probe substrate; an arm support portion including a support member extending in a direction intersecting the first direction in the vicinity of one end portion of the foot portion, and a diagonal member that couples from any point on the support member to a point between the other end portion and the center of the foot portion; and a cantilever-structured arm portion having a fixed end and a free end, in which a contact portion that comes into contact with an inspection object is formed at a tip of the free end and the fixed end is coupled to the arm support portion.
Claims4
A probe for use in an electrical connection apparatus, comprising:
- a foot portion having an elongated shape extending in a first direction, and having a joint portion that joins to a probe substrate;
- an arm support portion including a support member extending in a direction intersecting the first direction in a vicinity of one end portion of the foot portion, and a diagonal member that couples from any point on the support member to a point between the other end portion and the center of the foot portion;
- and
- a cantilever-structured arm portion having a fixed end and a free end, in which a contact portion that comes into contact with an inspection object is formed at a tip of the free end and the fixed end is coupled to the arm support portion.
Dependencies are inferred from the claim text.