Socketed probes
OwnerRaul Molinainventor
Life of this patent
Estimating the term…
Abstract
A modular/configurable space transformer system may comprise socketed probes, an upper guide plate, a lower guide plate, and a spacer. A socketed probe may comprise an upper support arm with positioning tabs for insertion into slots in the upper guide plate, as well as a PCB contact point for making a conductive connection with a PCB pad. The socketed probe may additionally comprise a lower support arm with a positioning tab for insertion into a slot in an upper guide plate, as well as a DUT (device under testing) contact point for making a conductive connection with a DUT pad. The spacer may separate the upper guide plate and lower guide plate.
Claims20
A socketed probe, comprising:
- an upper assembly;
- a lower assembly;
- and
- a connector arm connecting the upper assembly to the lower assembly;
- wherein:
- the upper assembly comprises:
- an upper horizontal support arm;
- a contact support arm;
- a cantilever spring arm;
- a contact point arm;
- a contact configured to be displaced in an upper assembly contact principal displacement direction through planar compression of the cantilever spring arm;
- and
- an upper support arm fine positioning tab;
- the lower assembly comprises:
- a lower horizontal support arm;
- a contact point arm;
- a contact;
- and
- a lower support arm fine positioning tab;
- the upper support arm fine positioning tab is configured to be inserted into a slot such that the insertion movement is parallel to the upper assembly contact principal displacement direction;
- the lower support arm fine positioning tab is configured to be inserted into a slot such that the insertion movement is parallel to the upper assembly contact principal displacement direction;
- and
- the insertion movement of the upper support arm fine positioning tab is in the same direction as the insertion movement of the lower support arm fine positioning tab.
A socketed probe system, comprising:
- an upper guide plate;
- a lower guide plate;
- a spacer;
- and
- a socketed probe;
- wherein:
- the socketed probe comprises an upper assembly, a lower assembly, and a connector arm connecting the upper assembly to the lower assembly;
- the upper assembly comprises:
- an upper horizontal support arm;
- a contact support arm;
- a cantilever spring arm;
- a contact point arm;
- a contact configured to be displaced in an upper assembly contact principal displacement direction through planar compression of the cantilever spring arm;
- and
- an upper support arm fine positioning tab;
- the lower assembly comprises:
- a lower horizontal support arm;
- a contact point arm;
- a contact;
- and
- a lower support arm fine positioning tab;
- the upper support arm fine positioning tab is configured to be inserted into an upper guide plate slot such that the insertion movement is parallel to the upper assembly contact principal displacement direction;
- the lower support arm fine positioning tab is configured to be inserted into a slot such that the insertion movement is parallel to the upper assembly contact principal displacement direction;
- the insertion movement of the upper support arm fine positioning tab is in the same direction as the insertion movement of the lower support arm fine positioning tab;
- the upper guide plate comprises the upper guide plate slot dimensioned for insertion of the upper support arm fine positioning tab;
- the lower guide plate comprises a slot dimensioned for insertion of the lower support arm fine positioning tab;
- the upper guide plate and the lower guide plate are substantially parallel to each other;
- and
- the spacer is configured to maintain a constant distance between the upper guide plate and the lower guide plate.
Dependencies are inferred from the claim text.