G11C 29/32
Serial access
Official title: Serial access; Scan testing
G11C29/32 (Serial access) appears on 498 US grants and 415 published applications in this corpus.
Search patents in G11C- Granted patents
- 498
- Published applications
- 415
- Assignees
- 153
- Inventors
- 960
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 4 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 2 | 0 |
| 1990 | 4 | 0 |
| 1991 | 3 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 3 | 0 |
| 1995 | 7 | 0 |
| 1996 | 6 | 0 |
| 1997 | 10 | 0 |
| 1998 | 18 | 0 |
| 1999 | 24 | 0 |
| 2000 | 14 | 0 |
| 2001 | 8 | 1 |
| 2002 | 3 | 2 |
| 2003 | 6 | 5 |
| 2004 | 5 | 9 |
| 2005 | 5 | 13 |
| 2006 | 9 | 11 |
| 2007 | 9 | 18 |
| 2008 | 11 | 15 |
| 2009 | 16 | 16 |
| 2010 | 11 | 16 |
| 2011 | 21 | 8 |
| 2012 | 10 | 13 |
| 2013 | 16 | 14 |
| 2014 | 17 | 22 |
| 2015 | 15 | 13 |
| 2016 | 11 | 16 |
| 2017 | 20 | 15 |
| 2018 | 17 | 21 |
| 2019 | 17 | 20 |
| 2020 | 30 | 25 |
| 2021 | 23 | 35 |
| 2022 | 31 | 21 |
| 2023 | 23 | 23 |
| 2024 | 21 | 28 |
| 2025 | 15 | 16 |
| 2026 | 23 | 19 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Scannable SRAM29 Sep 2026US 12,749,528 B2SambaNova Systems, Inc.
- Fully scannable memory arrays4 Aug 2026US 12,700,471 B2SambaNova Systems, Inc.
- Triple via chain for advanced interconnect in a memory device28 Jul 2026US 12,694,939 B2Micron Technology, Inc.
- Nonvolatile memory device, storage device having the same, and testing method thereof28 Jul 2026US 12,694,940 B2Samsung Electronics Co., Ltd.
- Scannable memory subsystem14 Jul 2026US 12,682,973 B2SambaNova Systems, Inc.
- Parallel operations in compute systems17 Sep 2026US 2026/0279480 A1OpenAI OpCo, LLC
- Semiconductor device for performing test operation of through-silicon vias13 Aug 2026US 2026/0235677 A1Samsung Electronics Co., Ltd.
- Processor-based system supporting in-field testing using external dynamic random access memory (dram) for storing and accessing test scan data13 Aug 2026US 2026/0236363 A1Microsoft Technology Licensing, LLC
- Scan Clocking30 Jul 2026US 2026/0221210 A1Texas Instruments Incorporated
- Scan-path integrated circuit memory with output bus feedback9 Jul 2026US 2026/0196286 A1SambaNova Systems, Inc.
Most cited
By later US patents
- Scannable sense amplifier circuit421US 5,915,084 AAdvanced Micro Devices, Inc. · 1999
- Programmable logic array integrated circuits159US 5,828,229 AAltera Corporation · 1998
- Processor based BIST for an embedded memory126US 5,961,653 AInternational Business Machines Corporation · 1999
- Built-in self test for integrated circuits having read/write memory125US 5,568,437 AVLSI Technology, Inc. · 1996
- Programmable computer system element with built-in self test method and apparatus for repair during power-on88US 5,659,551 AInternational Business Machines Corporation · 1997