G01R 31/318525
Test of flip-flops or latches
Official title: {Test of flip-flops or latches}
G01R31/318525 (Test of flip-flops or latches) appears on 94 US grants and 86 published applications in this corpus.
Search patents in G01R- Granted patents
- 94
- Published applications
- 86
- Assignees
- 60
- Inventors
- 259
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 1 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 3 | 0 |
| 1993 | 0 | 0 |
| 1994 | 1 | 0 |
| 1995 | 4 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 1 | 0 |
| 2001 | 2 | 0 |
| 2002 | 5 | 2 |
| 2003 | 2 | 3 |
| 2004 | 2 | 0 |
| 2005 | 1 | 0 |
| 2006 | 1 | 1 |
| 2007 | 2 | 2 |
| 2008 | 1 | 6 |
| 2009 | 2 | 3 |
| 2010 | 3 | 2 |
| 2011 | 1 | 0 |
| 2012 | 2 | 1 |
| 2013 | 1 | 0 |
| 2014 | 2 | 4 |
| 2015 | 3 | 2 |
| 2016 | 2 | 2 |
| 2017 | 1 | 1 |
| 2018 | 5 | 8 |
| 2019 | 6 | 0 |
| 2020 | 1 | 3 |
| 2021 | 5 | 3 |
| 2022 | 2 | 5 |
| 2023 | 7 | 6 |
| 2024 | 12 | 16 |
| 2025 | 6 | 7 |
| 2026 | 5 | 9 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- State clearing of internal memory and flip-flops of a system using built-in test and scan circuitry8 Sep 2026US 12,730,940 B2Microsoft Technology Licensing, LLC
- Architecture for testing multiple scan chains30 Jun 2026US 12,669,541 B2STMicroelectronics International N. V.
- Scan flip-flops with pre-setting combinational logic28 Apr 2026US 12,613,278 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Electronic circuit and method of error correction10 Feb 2026US 12,546,821 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Systems and methods for scan chain interface for non-volatile storage bits13 Jan 2026US 12,525,272 B2Everspin Technologies, Inc.
- Fault detection17 Sep 2026US 2026/0276707 A1Arm Limited
- Scan Flip-Flops With Pre-Setting Combinational Logic13 Aug 2026US 2026/0235676 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Scannable multibit self-gating flip-flop system2 Jul 2026US 2026/0186053 A1Advanced Micro Devices, Inc.
- Electronic circuit and method of error correction21 May 2026US 2026/0140174 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Semiconductor device and method of testing semiconductor device14 May 2026US 2026/0133246 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Built-in self-testing for double data rate input/output94US 6,816,991 B2Sun Microsystems, Inc. · 2004
- Enhanced test circuit80US 5,084,874 ATexas Instruments Incorporated · 1992
- Method of locating a failed latch in a defective shift register69US 6,278,956 B1International Business Machines Corporation · 2001
- Flip-flop design and technique for scan chain diagnosis45US 5,881,067 ASun Microsystems, Inc. · 1999
- Digital variable-delay circuit having voltage-mixing interpolator and methods of testing input/output buffers using same35US 6,348,826 B1Intel Corporation · 2002