Loading patent…
AssigneeIntel Corporation
InventorsStephen R. Mooney, Matthew B. Haycock, Aaron K. Martin, Jonathan N. Spitz, Michael S. Sandhinti
Estimating the term…
A variable-delay circuit on an integrated circuit is used to delay a periodic strobe signal. In normal operation, the strobe signal can be shifted 90 degrees to center it within a data bit cell. In test mode, it can also be shifted up to 270 degrees in N increments to measure the effective input latch setup and hold timings. The variable-delay circuit comprises a voltage-mixing interpolator circuit to produce phase delays in N increments. The variable-delay circuit can incorporate an existing delay locked loop. Also described are an electronic system, a data processing system, and various methods of performing on-chip testing and calibration.
An interpolator circuit for providing a controllable phase offset comprising:
An interpolator circuit for providing a controllable phase offset comprising:
A variable-delay circuit comprising:
An integrated circuit having at least one variable-delay circuit comprising
An electronic system having at least one variable-delay circuit comprising:
A data processing system comprising:
A data processing system comprising:
A method for performing loopback testing of an integrated circuit having at least one input/output circuit to generate and to receive a data signal and a strobe signal, the integrated circuit further having at least one delay line, the delay line being coupled to the at least one input/output circuit, the method comprising:
In an integrated circuit comprising at least one input/output circuit to receive a data signal and a strobe signal, and further comprising at least one delay line coupled to the at least one input/output circuit to shift a phase of the strobe signal and to generate a strobe signal with a phase offset, the method comprising:
Dependencies are inferred from the claim text.