G01R 31/318522
Test of sequential circuits
Official title: {Test of Sequential circuits (test of microprocessors G06F11/2236, test of ALU's G06F11/2226)}
G01R31/318522 (Test of sequential circuits) appears on 215 US grants and 143 published applications in this corpus.
Search patents in G01R- Granted patents
- 215
- Published applications
- 143
- Assignees
- 108
- Inventors
- 497
- Latest grant
- 8 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 3 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 3 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 3 | 0 |
| 1988 | 5 | 0 |
| 1989 | 1 | 0 |
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 3 | 0 |
| 1993 | 1 | 0 |
| 1994 | 4 | 0 |
| 1995 | 10 | 0 |
| 1996 | 2 | 0 |
| 1997 | 5 | 0 |
| 1998 | 6 | 0 |
| 1999 | 7 | 0 |
| 2000 | 5 | 0 |
| 2001 | 9 | 1 |
| 2002 | 6 | 3 |
| 2003 | 5 | 15 |
| 2004 | 14 | 4 |
| 2005 | 5 | 1 |
| 2006 | 4 | 2 |
| 2007 | 4 | 2 |
| 2008 | 2 | 12 |
| 2009 | 5 | 4 |
| 2010 | 4 | 3 |
| 2011 | 3 | 0 |
| 2012 | 2 | 1 |
| 2013 | 1 | 0 |
| 2014 | 2 | 4 |
| 2015 | 3 | 3 |
| 2016 | 4 | 2 |
| 2017 | 1 | 1 |
| 2018 | 5 | 10 |
| 2019 | 9 | 1 |
| 2020 | 4 | 6 |
| 2021 | 7 | 6 |
| 2022 | 5 | 10 |
| 2023 | 13 | 11 |
| 2024 | 16 | 18 |
| 2025 | 10 | 13 |
| 2026 | 6 | 10 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- State clearing of internal memory and flip-flops of a system using built-in test and scan circuitry8 Sep 2026US 12,730,940 B2Microsoft Technology Licensing, LLC
- Architecture for testing multiple scan chains30 Jun 2026US 12,669,541 B2STMicroelectronics International N. V.
- Scan flip-flops with pre-setting combinational logic28 Apr 2026US 12,613,278 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Scan chain control17 Mar 2026US 12,578,386 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Electronic circuit and method of error correction10 Feb 2026US 12,546,821 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Fault detection17 Sep 2026US 2026/0276707 A1Arm Limited
- Scan Flip-Flops With Pre-Setting Combinational Logic13 Aug 2026US 2026/0235676 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Scannable multibit self-gating flip-flop system2 Jul 2026US 2026/0186053 A1Advanced Micro Devices, Inc.
- Scan chain control2 Jul 2026US 2026/0186056 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Electronic circuit and method of error correction21 May 2026US 2026/0140174 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- BIST tester for multiple memories98US 5,535,164 AInternational Business Machines Corporation · 1996
- Built-in self-testing for double data rate input/output94US 6,816,991 B2Sun Microsystems, Inc. · 2004
- Enhanced test circuit80US 5,084,874 ATexas Instruments Incorporated · 1992
- Method of locating a failed latch in a defective shift register69US 6,278,956 B1International Business Machines Corporation · 2001
- Self-diagnosable integrated circuit device capable of testing sequential circuit elements66US 4,754,215 ANEC Corporation · 1988