G01R 31/318527
Test of counters
Official title: {Test of counters}
G01R31/318527 (Test of counters) appears on 48 US grants and 9 published applications in this corpus.
Search patents in G01R- Granted patents
- 48
- Published applications
- 9
- Assignees
- 36
- Inventors
- 80
- Latest grant
- 17 Jun 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 3 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 6 | 0 |
| 1996 | 2 | 0 |
| 1997 | 2 | 0 |
| 1998 | 3 | 0 |
| 1999 | 3 | 0 |
| 2000 | 2 | 0 |
| 2001 | 2 | 0 |
| 2002 | 0 | 1 |
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 2 | 0 |
| 2006 | 0 | 0 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 0 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 0 |
| 2020 | 1 | 1 |
| 2021 | 0 | 1 |
| 2022 | 1 | 2 |
| 2023 | 3 | 1 |
| 2024 | 1 | 0 |
| 2025 | 1 | 2 |
By publication year. Applications have been published since 2001.
Recent patents
- Apparatus and method for implementing a scalable digital infrastructure for measuring ring oscillators17 Jun 2025US 12,332,306 B2Tokyo Electron U.S. Holdings, Inc.
- Apparatus, system, and method for achieving accurate insertion counts on removable modules13 Feb 2024US 11,901,898 B2Juniper Networks, Inc.
- Fail-safe counter evaluator to insure proper counting by a counter21 Nov 2023US 11,824,535 B2Siemens Aktiengesellschaft
- Multi-capture at-speed scan test based on a slow clock signal28 Mar 2023US 11,614,487 B2Siemens Industry Software Inc.
- Runtime measurement of process variations and supply voltage characteristics21 Feb 2023US 11,585,854 B1Xilinx, Inc.
- Method for testing a counter, corresponding processing system and computer program product25 Dec 2025US 2025/0389771 A1STMicroelectronics International N. V.
- Apparatus and method for implementing a scalable digital infrastructure for measuring ring oscillators9 Oct 2025US 2025/0315078 A1Tokyo Electron U.S. Holdings, Inc.
- Apparatus, system, and method for achieving accurate insertion counts on removable modules4 May 2023US 2023/0134891 A1Juniper Networks, Inc.
- Apparatus and method for implementing a scalable digital infrastructure for measuring ring oscillators29 Dec 2022US 2022/0413045 A1Tokyo Electron U.S. Holdings, Inc.
- Multi-capture at-speed scan test based on a slow clock signal20 Jan 2022US 2022/0018902 A1Siemens Industry Software Inc.
Most cited
By later US patents
- BIST tester for multiple memories98US 5,535,164 AInternational Business Machines Corporation · 1996
- BIST circuit for variable impedance system27US 6,509,778 B2International Business Machines Corporation · 2003
- Counter including two 2 bit counter segments connected in cascade each counting in Gray code20US 4,264,807 AInternational Business Machines Corporation · 1981
- High speed testing of integrated circuit18US 4,661,930 ATexas Instruments Incorporated · 1987
- Transparent testing of integrated circuits17US 5,469,445 ASofia Koloni, Ltd. · 1995