G01R 31/31853
Test of registers
Official title: {Test of registers}
G01R31/31853 (Test of registers) appears on 51 US grants and 31 published applications in this corpus.
Search patents in G01R- Granted patents
- 51
- Published applications
- 31
- Assignees
- 27
- Inventors
- 94
- Latest grant
- 17 Jun 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 2 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 2 | 0 |
| 1988 | 1 | 0 |
| 1989 | 0 | 0 |
| 1990 | 1 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 4 | 0 |
| 2003 | 2 | 8 |
| 2004 | 7 | 2 |
| 2005 | 1 | 1 |
| 2006 | 1 | 1 |
| 2007 | 2 | 0 |
| 2008 | 0 | 5 |
| 2009 | 3 | 0 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 1 | 1 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 1 | 1 |
| 2016 | 0 | 0 |
| 2017 | 0 | 0 |
| 2018 | 2 | 1 |
| 2019 | 1 | 1 |
| 2020 | 2 | 2 |
| 2021 | 1 | 0 |
| 2022 | 1 | 3 |
| 2023 | 3 | 2 |
| 2024 | 2 | 2 |
| 2025 | 3 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Processing devices for reducing scan traffic, method and computer program17 Jun 2025US 12,332,308 B2Intel Corporation
- Electronic fuse device and operation method thereof10 Jun 2025US 12,326,473 B2Faraday Technology Corp.
- High throughput sort3 Jun 2025US 12,320,845 B2Infineon Technologies AG
- Scan compression through pin data encoding1 Oct 2024US 12,105,145 B2STMicroelectronics International N. V.
- Data recorder9 Apr 2024US 11,953,547 B2BAE Systems Controls Inc.
- Electronic fuse device and operation method thereof30 Jan 2025US 2025/0037780 A1Faraday Technology Corp.
- High throughput sort12 Sep 2024US 2024/0302431 A1Infineon Technologies AG
- Processing Devices for reducing scan traffic, Method and Computer Program16 May 2024US 2024/0159829 A1Intel Corporation
- Scan compression through pin data encoding23 Nov 2023US 2023/0375617 A1STMicroelectronics International N. V.
- Data recorder29 Jun 2023US 2023/0204665 A1BAE Systems Controls Inc.
Most cited
By later US patents
- LSI Circuitry conforming to level sensitive scan design (LSSD) rules and method of testing same61US 4,298,980 AInternational Business Machines Corporation · 1981
- Look ahead scan chain diagnostic method51US 6,308,290 B1International Business Machines Corporation · 2001
- Digital variable-delay circuit having voltage-mixing interpolator and methods of testing input/output buffers using same35US 6,348,826 B1Intel Corporation · 2002
- Method of determining the number of individual integrated circuit computer chips or the like in a boundary scan test chain and the length of the chain22US 5,333,139 AIntel Corporation · 1994
- Linear feedback shift register for circuit design technology validation20US 4,713,605 AAdvanced Micro Devices, Inc. · 1987