G01R 1/07378
Using an intermediate adapter
Official title: {using an intermediate adapter, e.g. space transformers (G01R1/07371 takes precedence)}
G01R1/07378 (Using an intermediate adapter) appears on 711 US grants and 873 published applications in this corpus.
Search patents in G01R- Granted patents
- 711
- Published applications
- 873
- Assignees
- 256
- Inventors
- 1,333
- Latest grant
- 1 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 0 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 2 | 0 |
| 1981 | 1 | 0 |
| 1982 | 2 | 0 |
| 1983 | 1 | 0 |
| 1984 | 0 | 0 |
| 1985 | 4 | 0 |
| 1986 | 2 | 0 |
| 1987 | 2 | 0 |
| 1988 | 9 | 0 |
| 1989 | 8 | 0 |
| 1990 | 6 | 0 |
| 1991 | 0 | 0 |
| 1992 | 2 | 0 |
| 1993 | 3 | 0 |
| 1994 | 4 | 0 |
| 1995 | 5 | 0 |
| 1996 | 11 | 0 |
| 1997 | 3 | 0 |
| 1998 | 13 | 0 |
| 1999 | 10 | 0 |
| 2000 | 8 | 0 |
| 2001 | 18 | 12 |
| 2002 | 18 | 25 |
| 2003 | 22 | 27 |
| 2004 | 27 | 35 |
| 2005 | 26 | 25 |
| 2006 | 30 | 39 |
| 2007 | 21 | 30 |
| 2008 | 27 | 71 |
| 2009 | 18 | 35 |
| 2010 | 25 | 34 |
| 2011 | 30 | 28 |
| 2012 | 18 | 29 |
| 2013 | 19 | 25 |
| 2014 | 24 | 31 |
| 2015 | 25 | 28 |
| 2016 | 25 | 17 |
| 2017 | 25 | 33 |
| 2018 | 23 | 26 |
| 2019 | 26 | 34 |
| 2020 | 25 | 33 |
| 2021 | 33 | 29 |
| 2022 | 18 | 31 |
| 2023 | 27 | 34 |
| 2024 | 29 | 25 |
| 2025 | 25 | 22 |
| 2026 | 9 | 115 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Testing equipment and adapter1 Sep 2026US 12,724,039 B2Nanya Technology Corporation
- Abbreviated loopback attenuation18 Aug 2026US 12,710,450 B2FormFactor, Inc.
- Probe card for fine pitch circuit probe testing of semiconductor integrated circuit devices and methods of forming the same16 Jun 2026US 12,656,372 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Automatic test equipment12 May 2026US 12,625,178 B2Advantest Corporation
- Socketed probes14 Apr 2026US 12,601,758 B2
- Conductive probing interface device8 Oct 2026US 2026/0309775 A1International Business Machines Corporation
- Apparatus for testing an electronic device20 Aug 2026US 2026/0243803 A1JCET STATS ChipPAC Korea Limited
- Simultaneous Silicon Spring and Chip Singulation DRIE13 Aug 2026US 2026/0239987 A1
- High Current Column Grid Array Pillars13 Aug 2026US 2026/0240010 A1
- Probe head for a testing apparatus of electronic devices16 Jul 2026US 2026/0202439 A1Technoprobe S.P.A.
Most cited
By later US patents
- Sockets for electronic components and methods of connecting to electronic components453US 5,772,451 AForm Factor, Inc. · 1998
- Three dimensional high performance interconnection package422US 5,371,654 AInternational Business Machines Corporation · 1994
- Method of planarizing tips of probe elements of a probe card assembly397US 5,974,662 AFormFactor, Inc. · 1999
- Contact carriers (tiles) for populating larger substrates with spring contacts304US 5,806,181 AFormFactor, Inc. · 1998
- Test probe for high density integrated circuits, methods of fabrication thereof and methods of use thereof284US 5,821,763 AInternational Business Machines Corporation · 1998