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US 12,724,039 B2Granted
Testing equipment and adapter
AssigneeNanya Technology Corporation
InventorYuan Chen
Life of this patent
Estimating the term…
Abstract
A testing equipment includes a tester, a load board and an adapter. The load board is disposed on the tester. The adapter is disposed on the load board and configured to support a device under test. The adapter is electrically connected to the load board and the device under test. The tester is configured to transmit a testing signal to the device under test and receive a feedback signal from the device under test through the load board and the adapter.
Claims17
A testing equipment, comprising:
- a tester;
- a load board disposed on the tester;
- and
- an adapter, comprising:
- a socket directly disposed on the load board and electrically connected with the load board;
- and
- a connecting plate directly, detachably and electrically connected with the socket and configured to support a device under test, the connecting plate being electrically connected to the device under test, the connecting plate being spaced apart from and parallel with the load board;
- a frame defining an accommodation space, the tester and the load board being at least partially located in the accommodation space;
- a platform connected with the frame, the platform having an opening communicated with the accommodation space, the adapter being exposed through the opening;
- a probe holder disposed on the platform;
- and
- at least one probe held by the probe holder, the probe holder being configured to control the probe to contact with the device under test through the opening,
- wherein the tester is configured to transmit a testing signal to the device under test and receive a feedback signal from the device under test through the load board and the adapter.
10 more elements
An adapter, comprising:
- a socket disposed on and electrically connected with a load board, the socket having an opening facing to a direction intersecting with a normal of the load board;
- a connecting plate comprising:
- a plate body configured to be detachably inserted into the opening and electrically connected with the socket, the plate body defining a probe area away from the load board, the probe area being configured to place a device under test thereon, the plate body being electrically connected with the device under test;
- and
- a plurality of conductive portions located on the probe area and configured to electrically connect with the device under test;
- and
- a pair of guiding portions fixed to two opposite ends of the socket with a constant interval therebetween, the guiding portions being configured to abut against outer edges of the plate body to guide and hold the plate body therebetween, the conductive portions being at least partially aligned between the guiding portions.
4 more elements
Dependencies are inferred from the claim text.