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US 12,710,450 B2Granted
Abbreviated loopback attenuation
AssigneeFormFactor, Inc.
InventorsErnest Gammon McReynolds, Jerry Martyniuk, Tim Lesher, Tomoe Yokoyama, David Raschko, Uyen Nguyen, Pratik Bakul Ghate
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Abstract
Improved performance for attenuated testing when probing a device under test with a probe array is provided. By moving the attenuation components from their conventional location on the printed circuit board of the probe head to the space transformer of the probe head, electrical path lengths can be decreased, thereby improving performance. This is particularly helpful in connection with loopback testing.
Claims13
A method of providing a specified attenuation for probe testing, the method comprising:
- making temporary electrical contact between a probe head and a device under test;
- and
- performing electrical testing of the device under test using the probe head;
- wherein the probe head includes a space transformer having a first side in electrical contact with test equipment and a second side in direct electrical contact with a probe array;
- wherein the electrical testing includes at least one test where an attenuation for the electrical testing is provided by one or more resistive components disposed on the space transformer;
- wherein the electrical testing includes at least one loopback test where a first probe of the probe array receives a signal from the device under test and where a second probe of the probe array provides an attenuated version of the signal to the device under test;
- wherein the attenuated version of the signal is attenuated by the one or more resistive components disposed on the space transformer.
4 more elements
Dependencies are inferred from the claim text.