G11C 2029/1802
Address decoder
Official title: {Address decoder}
G11C2029/1802 (Address decoder) appears on 157 US grants and 164 published applications in this corpus.
Search patents in G11C- Granted patents
- 157
- Published applications
- 164
- Assignees
- 57
- Inventors
- 333
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1997 | 1 | 0 |
| 1998 | 1 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 1 | 3 |
| 2003 | 6 | 6 |
| 2004 | 7 | 9 |
| 2005 | 2 | 0 |
| 2006 | 5 | 0 |
| 2007 | 1 | 6 |
| 2008 | 3 | 6 |
| 2009 | 6 | 8 |
| 2010 | 6 | 1 |
| 2011 | 4 | 3 |
| 2012 | 3 | 2 |
| 2013 | 2 | 1 |
| 2014 | 2 | 0 |
| 2015 | 1 | 4 |
| 2016 | 4 | 5 |
| 2017 | 6 | 4 |
| 2018 | 3 | 2 |
| 2019 | 2 | 6 |
| 2020 | 7 | 8 |
| 2021 | 8 | 16 |
| 2022 | 22 | 19 |
| 2023 | 18 | 21 |
| 2024 | 20 | 13 |
| 2025 | 6 | 10 |
| 2026 | 9 | 11 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Partial array sparing in a memory22 Sep 2026US 12,744,105 B2International Business Machines Corporation
- Fully scannable memory arrays4 Aug 2026US 12,700,471 B2SambaNova Systems, Inc.
- Memory device and operating method thereof23 Jun 2026US 12,664,061 B2Samsung Electronics Co., Ltd.
- Parallel operations in compute systems16 Jun 2026US 12,658,272 B2OpenAI OpCo, LLC
- Method for scanning a memory array26 May 2026US 12,640,219 B2SambaNova Systems, Inc.
- Memory device and operating method thereof1 Oct 2026US 2026/0300109 A1Samsung Electronics Co., Ltd.
- Memory Array Column Configured as a Monolithic Unit Within an Integrated Circuit Scan Chain24 Sep 2026US 2026/0290483 A1SambaNova Systems, Inc.
- Method and architecture for efficient delay decoder test of memories17 Sep 2026US 2026/0279479 A1STMicroelectronics International N. V.
- Parallel operations in compute systems17 Sep 2026US 2026/0279480 A1OpenAI OpCo, LLC
- Testing method for memory device18 Jun 2026US 2026/0171179 A1Powerchip Semiconductor Manufacturing Corporation
Most cited
By later US patents
- On-the-fly memory testing and automatic generation of bitmaps52US 6,550,023 B1Hewlett-Packard Development Company, L. P. · 2003
- Semiconductor memory device and method of performing burn-in test on the same46US 8,780,617 B2Samsung Electronics Co., Ltd. · 2014
- System for generating a test pattern to detect and isolate stuck faults for an interface using transition coding21US 9,852,806 B2Kandou Labs, S.A. · 2017
- Low-power read circuit and method for controlling a sense amplifier18US 5,619,466 ASGS-Thomson Microelectronics S.A. · 1997
- Semiconductor memory device allowing acceleration testing, and a semi-finished product for an integrated semiconductor device that allows acceleration testing18US 5,706,233 AMitsubishi Denki Kabushiki Kaisha · 1998