G01R 31/318577
Ac testing
Official title: {AC testing, e.g. current testing, burn-in}
G01R31/318577 (Ac testing) appears on 347 US grants and 275 published applications in this corpus.
Search patents in G01R- Granted patents
- 347
- Published applications
- 275
- Assignees
- 114
- Inventors
- 555
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 2 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 0 | 0 |
| 1984 | 0 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 1 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 4 | 0 |
| 1992 | 1 | 0 |
| 1993 | 3 | 0 |
| 1994 | 4 | 0 |
| 1995 | 4 | 0 |
| 1996 | 10 | 0 |
| 1997 | 11 | 0 |
| 1998 | 9 | 0 |
| 1999 | 8 | 0 |
| 2000 | 11 | 0 |
| 2001 | 5 | 3 |
| 2002 | 13 | 18 |
| 2003 | 11 | 16 |
| 2004 | 14 | 17 |
| 2005 | 15 | 25 |
| 2006 | 16 | 16 |
| 2007 | 17 | 18 |
| 2008 | 18 | 13 |
| 2009 | 15 | 18 |
| 2010 | 15 | 11 |
| 2011 | 25 | 24 |
| 2012 | 8 | 4 |
| 2013 | 14 | 16 |
| 2014 | 12 | 8 |
| 2015 | 11 | 7 |
| 2016 | 9 | 9 |
| 2017 | 6 | 7 |
| 2018 | 10 | 7 |
| 2019 | 5 | 5 |
| 2020 | 7 | 6 |
| 2021 | 6 | 5 |
| 2022 | 3 | 5 |
| 2023 | 9 | 6 |
| 2024 | 5 | 3 |
| 2025 | 3 | 5 |
| 2026 | 2 | 3 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Characterizing path margin monitors without the use of scan chains16 Jun 2026US 12,656,391 B2Synopsys, Inc.
- Array of through-silicon via contact points on a semiconductor die10 Mar 2026US 12,571,840 B2Texas Instruments Incorporated
- Scan testing using scan frames with embedded commands11 Nov 2025US 12,467,971 B2Texas Instruments Incorporated
- Testing circuit4 Nov 2025US 12,461,150 B2Global Unichip Corporation
- Test pattern generation using multiple scan enables1 Jul 2025US 12,345,764 B2STMicroelectronics International N. V.
- Select gate scan using double verify20 Aug 2026US 2026/0243822 A1Micron Technology, Inc.
- Array of Contact Points on a Die2 Jul 2026US 2026/0186051 A1
- Test pattern generating method and device1 Jan 2026US 2026/0002991 A1Samsung Electronics Co., Ltd.
- Critical path sensitization in electronic systems30 Oct 2025US 2025/0334635 A1NXP B. V.
- Monitor block, interface circuit, and method of operating debugging system31 Jul 2025US 2025/0244385 A1Samsung Electronics Co., Ltd.
Most cited
By later US patents
- Method and apparatus for evaluating and optimizing a signaling system146US 7,490,275 B2Rambus Inc. · 2009
- Multiple clock rate test apparatus for testing digital systems134US 5,349,587 ANorthern Telecom Limited · 1994
- Method and apparatus for buffer self-test and characterization118US 5,621,739 AIntel Corporation · 1997
- Method and apparatus for testing circuits with multiple clocks117US 6,442,722 B1LogicVision, Inc. · 2002
- Bist architecture for measurement of integrated circuit delays95US 5,923,676 ALogic Vision, Inc. · 1999