G01R 31/318511
Wafer test
Official title: {Wafer Test}
G01R31/318511 (Wafer test) appears on 445 US grants and 402 published applications in this corpus.
Search patents in G01R- Granted patents
- 445
- Published applications
- 402
- Assignees
- 154
- Inventors
- 730
- Latest grant
- 12 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1977 | 1 | 0 |
| 1978 | 0 | 0 |
| 1979 | 0 | 0 |
| 1980 | 1 | 0 |
| 1981 | 1 | 0 |
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 3 | 0 |
| 1991 | 3 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 2 | 0 |
| 1995 | 3 | 0 |
| 1996 | 2 | 0 |
| 1997 | 3 | 0 |
| 1998 | 5 | 0 |
| 1999 | 10 | 0 |
| 2000 | 9 | 0 |
| 2001 | 14 | 4 |
| 2002 | 12 | 15 |
| 2003 | 9 | 19 |
| 2004 | 19 | 17 |
| 2005 | 17 | 28 |
| 2006 | 16 | 20 |
| 2007 | 26 | 35 |
| 2008 | 28 | 29 |
| 2009 | 22 | 21 |
| 2010 | 28 | 25 |
| 2011 | 24 | 29 |
| 2012 | 15 | 14 |
| 2013 | 22 | 15 |
| 2014 | 12 | 8 |
| 2015 | 15 | 11 |
| 2016 | 13 | 12 |
| 2017 | 13 | 8 |
| 2018 | 7 | 8 |
| 2019 | 9 | 9 |
| 2020 | 9 | 12 |
| 2021 | 7 | 15 |
| 2022 | 12 | 17 |
| 2023 | 20 | 12 |
| 2024 | 13 | 6 |
| 2025 | 11 | 9 |
| 2026 | 5 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Testing circuitry in a stacked semiconductor device using through silicon vias12 May 2026US RE50,887 E1Longitude Licensing Limited
- Wafer scale active thermal interposer for device testing28 Apr 2026US 12,613,273 B2Advantest Test Solutions, Inc.
- Wafer scale active thermal interposer for device testing3 Feb 2026US 12,540,967 B2Advantest Test Solutions, Inc.
- Wafer scale active thermal interposer for device testing3 Feb 2026US 12,540,968 B2Advantest Test Solutions, Inc.
- Wafer scale active thermal interposer for device testing27 Jan 2026US 12,535,522 B2Advantest Test Solutions, Inc.
- Wafer scale active thermal interposer for device testing30 Jul 2026US 2026/0219315 A1Advantest Test Solutions, Inc.
- System for testing semiconductors and corresponding test method16 Apr 2026US 2026/0104445 A1STMicroelectronics International N. V.
- Built in self-test of heterogeneous integrated radio frequency chiplets22 Jan 2026US 2026/0023115 A1PseudolithIC, Inc.
- Systems, devices, and methods for performing a non-contact electrical measurement on a cell, non-contact electrical measurement cell vehicle, chip, wafer, die, or logic block8 Jan 2026US 2026/0009845 A1PDF Solutions, Inc.
- Apparatus and method for implementing a scalable digital infrastructure for measuring ring oscillators9 Oct 2025US 2025/0315078 A1Tokyo Electron U.S. Holdings, Inc.
Most cited
By later US patents
- Making and testing an integrated circuit using high density probe points307US 5,103,557 A1992
- Semiconductor dies and wafers and methods for making186US 5,059,899 AMicron Technology, Inc. · 1991
- Self-configurable computer and memory system127US 4,191,996 A1980
- Testing and exercising individual, unsingulated dies on a wafer111US 5,442,282 ALSI Logic Corporation · 1995
- System and apparatus for using test structures inside of a chip during the fabrication of the chip108US 7,256,055 B2tau-Metrix, Inc. · 2007