H01J 2237/285
Emission microscopes
H01J2237/285 (Emission microscopes) appears on 59 US grants and 71 published applications in this corpus.
Search patents in H01J- Granted patents
- 59
- Published applications
- 71
- Assignees
- 44
- Inventors
- 132
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 1 | 2 |
| 2004 | 1 | 1 |
| 2005 | 0 | 3 |
| 2006 | 3 | 1 |
| 2007 | 1 | 2 |
| 2008 | 2 | 5 |
| 2009 | 1 | 1 |
| 2010 | 2 | 0 |
| 2011 | 3 | 4 |
| 2012 | 3 | 6 |
| 2013 | 1 | 0 |
| 2014 | 1 | 2 |
| 2015 | 1 | 5 |
| 2016 | 4 | 3 |
| 2017 | 3 | 3 |
| 2018 | 3 | 3 |
| 2019 | 4 | 4 |
| 2020 | 5 | 6 |
| 2021 | 6 | 7 |
| 2022 | 3 | 4 |
| 2023 | 3 | 3 |
| 2024 | 2 | 2 |
| 2025 | 1 | 3 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Electron beam application apparatus and inspection method25 Aug 2026US 12,719,008 B2Hitachi High-Tech Corporation
- Tomographic atom probe with terahertz pulse generator5 May 2026US 12,620,551 B2Centre National De La Recherche Scientifique
- Device for observing permeation and diffusion path of observation target gas, observation target gas measuring method, point-defect location detecting device, point-defect location detecting method, and observation samples27 May 2025US 12,315,696 B2National Institute for Materials Science
- Aperture device and analyzer arrangement26 Mar 2024US 11,942,316 B2Scienta Omicron AB
- Electron beam application apparatus27 Feb 2024US 11,915,903 B2Hitachi High-Tech Corporation
- Switching between vacuum-pressure operation and near-atmospheric-pressure operation in a material analysis system14 May 2026US 2026/0135073 A1SPECS Surface Nano Analysis GmbH
- Dynamic multi-wavelength and sample voltage atom probe tomograph feedback control system23 Oct 2025US 2025/0327763 A1
- Shielding plasma etching data collection windows using positively charged conductive films12 Jun 2025US 2025/0191890 A1International Business Machines Corporation
- Automatic grid finger detection22 May 2025US 2025/0166964 A1FEI Company
- Atom probe tomography specimen preparation28 Nov 2024US 2024/0395636 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Charged particle beam apparatus and method for operating the same178US 7,045,781 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH · 2006
- Charged particle beam apparatus and method for operating the same159US 7,274,018 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH · 2007
- Particle beam system and method for the particle-optical examination of an object36US 10,535,494 B2Carl Zeiss Microscopy GmbH · 2020
- Method of detecting electrons, an electron-detector and an inspection system36US 9,336,982 B2Carl Zeiss Microscopy GmbH · 2016
- Subpicosecond atomic and molecular motion detection and signal transmission by field emission27US 5,151,594 AInternational Business Machines Corporation · 1992