H01J 2237/2852
Auto-emission
Official title: Auto-emission (i.e. field-emission)
H01J2237/2852 (Auto-emission) appears on 13 US grants and 17 published applications in this corpus.
Search patents in H01J- Granted patents
- 13
- Published applications
- 17
- Assignees
- 15
- Inventors
- 35
- Latest grant
- 17 Oct 2023
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 0 | 1 |
| 2006 | 1 | 0 |
| 2007 | 0 | 1 |
| 2008 | 0 | 2 |
| 2009 | 0 | 0 |
| 2010 | 1 | 0 |
| 2011 | 0 | 1 |
| 2012 | 0 | 0 |
| 2013 | 0 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 1 | 1 |
| 2018 | 0 | 1 |
| 2019 | 1 | 2 |
| 2020 | 3 | 2 |
| 2021 | 3 | 1 |
| 2022 | 0 | 1 |
| 2023 | 1 | 0 |
| 2024 | 0 | 1 |
| 2025 | 0 | 1 |
By publication year. Applications have been published since 2001.
Recent patents
- Automated tomography field ion microscope17 Oct 2023US 11,791,129 B2Centre National De La Recherche Scientifique
- Atom probe tomography specimen preparation10 Aug 2021US 11,088,036 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Atom probe inspection device, field ion microscope, and distortion correction method9 Feb 2021US 10,916,405 B2Toshiba Memory Corporation
- Method and apparatus for atomic probe tomography26 Jan 2021US 10,903,045 B2Imec Vzw
- Systems and methods of aberration correction for atom probe tomography25 Aug 2020US 10,755,891 B2Colorado School of Mines
- Automatic grid finger detection22 May 2025US 2025/0166964 A1FEI Company
- Atom probe tomography specimen preparation28 Nov 2024US 2024/0395636 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Automated tomography field ion microscope5 May 2022US 2022/0139666 A1Centre National De La Recherche Scientifique
- Atom probe tomography specimen preparation4 Nov 2021US 2021/0343603 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Atom probe inspection device, field ion microscope, and distortion correction method10 Sep 2020US 2020/0286711 A1Toshiba Memory Corporation
Most cited
By later US patents
- Subpicosecond atomic and molecular motion detection and signal transmission by field emission27US 5,151,594 AInternational Business Machines Corporation · 1992
- Scanning atom probe11US 6,797,952 B2Kanazawa Institute of Technology · 2004
- Sparse sampling methods and probe systems for analytical instruments4US 10,431,419 B2Battelle Memorial Institute · 2019
- Atom probe tomography specimen preparation3US 11,088,036 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2021
- Methods for stabilizing biological and soft materials for atom probe tomography2US 10,684,308 B12020