Tomographic atom probe with terahertz pulse generator

A tomographic atom probe comprising an analysis chamber operating at ambient temperature, said analysis chamber having a sample (E) of material in the form of a nanotip mounted on an anti-vibration support, said nanotip being brought to a temperature of between 0 kelvin and ambient temperature by a cryogenic device, said nanotip being biased at an adjustable positive voltage of between 1 kV and 15 kV by an electronic device, said analysis chamber comprising a position-sensitive and time of flight-sensitive ion detector, wherein said atom probe comprises a generator for generating high-peak-intensity single-cycle ultrashort terahertz pulses, the analysis chamber comprising optical means for focusing said terahertz pulses on the nanotip, the focusing of the terahertz pulses causing the atoms of the nanotip to evaporate through the field effect without thermal effects, wherein the terahertz pulse generator produces optical single-cycle pulses with an amplitude greater than 10 kV/cm.