H01J 2237/2855
Photo-emission
H01J2237/2855 (Photo-emission) appears on 33 US grants and 41 published applications in this corpus.
Search patents in H01J- Granted patents
- 33
- Published applications
- 41
- Assignees
- 29
- Inventors
- 78
- Latest grant
- 25 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 3 |
| 2006 | 3 | 1 |
| 2007 | 1 | 1 |
| 2008 | 2 | 4 |
| 2009 | 1 | 1 |
| 2010 | 1 | 0 |
| 2011 | 3 | 4 |
| 2012 | 2 | 5 |
| 2013 | 1 | 0 |
| 2014 | 1 | 1 |
| 2015 | 0 | 1 |
| 2016 | 0 | 2 |
| 2017 | 1 | 1 |
| 2018 | 2 | 2 |
| 2019 | 3 | 2 |
| 2020 | 1 | 3 |
| 2021 | 3 | 2 |
| 2022 | 1 | 3 |
| 2023 | 1 | 2 |
| 2024 | 2 | 0 |
| 2025 | 0 | 1 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Electron beam application apparatus and inspection method25 Aug 2026US 12,719,008 B2Hitachi High-Tech Corporation
- Tomographic atom probe with terahertz pulse generator5 May 2026US 12,620,551 B2Centre National De La Recherche Scientifique
- Aperture device and analyzer arrangement26 Mar 2024US 11,942,316 B2Scienta Omicron AB
- Electron beam application apparatus27 Feb 2024US 11,915,903 B2Hitachi High-Tech Corporation
- Apparatus for transmission electron microscopy cathodoluminescence27 Jun 2023US 11,688,581 B2Gatan, Inc.
- Switching between vacuum-pressure operation and near-atmospheric-pressure operation in a material analysis system14 May 2026US 2026/0135073 A1SPECS Surface Nano Analysis GmbH
- Dynamic multi-wavelength and sample voltage atom probe tomograph feedback control system23 Oct 2025US 2025/0327763 A1
- Computer-implemented method for generating event-averaged and time-resolved spectra5 Oct 2023US 2023/0314351 A1Scienta Omicron AB
- Electron beam application apparatus and inspection method9 Mar 2023US 2023/0071801 A1Hitachi High-Tech Corporation
- Electron beam application apparatus6 Oct 2022US 2022/0319798 A1Hitachi High-Tech Corporation
Most cited
By later US patents
- Charged particle beam apparatus and method for operating the same178US 7,045,781 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH · 2006
- Charged particle beam apparatus and method for operating the same159US 7,274,018 B2ICT Integrated Circuit Testing Gesellschaft für Halbleiterprüftechnik mbH · 2007
- Inspection device27US 8,497,476 B2Ebara Corporation · 2013
- Method and system for ultrafast photoelectron microscope25US 7,154,091 B2California Institute of Technology · 2006
- Combination laser and charged particle beam system17US 8,314,410 B2FEI Company · 2012