G11C 29/4401
For self repair
Official title: {for self repair}
G11C29/4401 (For self repair) appears on 1,492 US grants and 1,719 published applications in this corpus.
Search patents in G11C- Granted patents
- 1,492
- Published applications
- 1,719
- Assignees
- 282
- Inventors
- 2,618
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 0 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 0 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 6 | 0 |
| 2001 | 7 | 3 |
| 2002 | 3 | 6 |
| 2003 | 6 | 11 |
| 2004 | 12 | 30 |
| 2005 | 21 | 27 |
| 2006 | 24 | 36 |
| 2007 | 34 | 28 |
| 2008 | 34 | 33 |
| 2009 | 29 | 25 |
| 2010 | 34 | 27 |
| 2011 | 27 | 16 |
| 2012 | 17 | 14 |
| 2013 | 27 | 30 |
| 2014 | 31 | 47 |
| 2015 | 42 | 52 |
| 2016 | 55 | 48 |
| 2017 | 56 | 60 |
| 2018 | 50 | 66 |
| 2019 | 66 | 70 |
| 2020 | 102 | 119 |
| 2021 | 106 | 150 |
| 2022 | 150 | 218 |
| 2023 | 185 | 167 |
| 2024 | 191 | 155 |
| 2025 | 122 | 113 |
| 2026 | 51 | 168 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Interrupting a memory built-in self-test15 Sep 2026US 12,738,338 B2Micron Technology, Inc.
- Read command fault detection in a memory system1 Sep 2026US 12,725,675 B2Micron Technology, Inc.
- System and method for memory bad block management25 Aug 2026US 12,717,492 B2Samsung Electronics Co., Ltd.
- Storage apparatus including word line grouping device and operating method thereof25 Aug 2026US 12,718,894 B2SK hynix Inc.
- Wordline group-based identification of good memory blocks during a programming operation18 Aug 2026US 12,711,055 B2Micron Technology, Inc.
- In-system on-chip memory repair for safety critical applications and automotive design10 Sep 2026US 2026/0268998 A1QUALCOMM Incorporated
- Memory devices and memory systems27 Aug 2026US 2026/0253645 A1Ftmos, LLC
- Method for lut-free memory repair27 Aug 2026US 2026/0253660 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Multi-level cell data encoding20 Aug 2026US 2026/0245645 A1
- Simultaneous Silicon Spring and Chip Singulation DRIE13 Aug 2026US 2026/0239987 A1
Most cited
By later US patents
- System and method for self-testing and repair of memory modules168US 6,754,117 B2Micron Technology, Inc. · 2004
- Multi-chip package having repairable embedded memories on a system chip with an EEPROM chip storing repair information161US 7,053,470 B1Azul Systems, Inc. · 2006
- Integrated memory and method for testing and repairing the integrated memory144US 6,590,816 B2Infineon Technologies AG · 2003
- Efficient retry mechanism for solid-state memory failures136US 8,788,880 B1Western Digital Technologies, Inc. · 2014
- Method of managing defects in flash disk memories127US 5,473,753 AIntel Corporation · 1995