G11C 29/24
Accessing extra cells
Official title: Accessing extra cells, e.g. dummy cells or redundant cells
G11C29/24 (Accessing extra cells) appears on 699 US grants and 569 published applications in this corpus.
Search patents in G11C- Granted patents
- 699
- Published applications
- 569
- Assignees
- 198
- Inventors
- 1,304
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 3 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 1 | 0 |
| 1986 | 4 | 0 |
| 1987 | 0 | 0 |
| 1988 | 6 | 0 |
| 1989 | 7 | 0 |
| 1990 | 3 | 0 |
| 1991 | 2 | 0 |
| 1992 | 3 | 0 |
| 1993 | 6 | 0 |
| 1994 | 10 | 0 |
| 1995 | 13 | 0 |
| 1996 | 15 | 0 |
| 1997 | 15 | 0 |
| 1998 | 22 | 0 |
| 1999 | 19 | 0 |
| 2000 | 10 | 0 |
| 2001 | 14 | 4 |
| 2002 | 15 | 19 |
| 2003 | 22 | 18 |
| 2004 | 12 | 19 |
| 2005 | 12 | 17 |
| 2006 | 21 | 22 |
| 2007 | 20 | 21 |
| 2008 | 18 | 28 |
| 2009 | 22 | 14 |
| 2010 | 15 | 17 |
| 2011 | 18 | 11 |
| 2012 | 21 | 15 |
| 2013 | 24 | 28 |
| 2014 | 16 | 8 |
| 2015 | 13 | 21 |
| 2016 | 18 | 21 |
| 2017 | 29 | 19 |
| 2018 | 19 | 26 |
| 2019 | 27 | 24 |
| 2020 | 30 | 44 |
| 2021 | 47 | 40 |
| 2022 | 25 | 43 |
| 2023 | 33 | 29 |
| 2024 | 35 | 26 |
| 2025 | 18 | 17 |
| 2026 | 13 | 18 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method, system and computer program product for memory repair22 Sep 2026US 12,744,103 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Apparatuses and methods for testing memory devices30 Jun 2026US 12,670,967 B2Micron Technology, Inc.
- Nonvolatile semiconductor memory device9 Jun 2026US 12,651,636 B2Kioxia Corporation
- Strobe delay calibration for unmatched receive memory26 May 2026US 12,640,185 B2Intel Corporation
- Method of testing a memory circuit and memory circuit19 May 2026US 12,633,368 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Method, system, device, and storage medium for determining wck-on value of lpddr chip30 Jul 2026US 2026/0221212 A1Shenzhen Rayson Technology Co., Ltd.
- Apparatuses, systems, and methods for storing memory metadata2 Jul 2026US 2026/0186896 A1Micron Technology, Inc.
- Internal voltage generation circuits controlling driving force for driving internal voltage2 Jul 2026US 2026/0188358 A1SK hynix Inc.
- Defect detection method for memory device2 Jul 2026US 2026/0188406 A1Powerchip Semiconductor Manufacturing Corporation
- Dram retention test method for dynamic error correction2 Jul 2026US 2026/0188410 A1Rambus Inc.
Most cited
By later US patents
- Method circuit and system for read error detection in a non-volatile memory array317US 6,992,932 B2Saifun Semiconductors Ltd. · 2006
- Semiconductor memory device capable of generating internal data read timing precisely212US 6,760,269 B2Renesas Technology Corp. · 2004
- Memory array organization and related test method particularly well suited for integrated circuits having write-once memory arrays204US 6,407,953 B1Matrix Semiconductor, Inc. · 2002
- Tracking capacitive loads180US 8,605,523 B2Taiwan Semiconductor Manufacturing Company.Ltd · 2013
- System and method for simulating an aspect of a memory circuit133US 7,609,567 B2Metaram, Inc. · 2009