G11C 29/20
Using counters or linear-feedback shift registers [lfsr]
Official title: using counters or linear-feedback shift registers [LFSR]
G11C29/20 (Using counters or linear-feedback shift registers [lfsr]) appears on 313 US grants and 268 published applications in this corpus.
Search patents in G11C- Granted patents
- 313
- Published applications
- 268
- Assignees
- 120
- Inventors
- 627
- Latest grant
- 18 Aug 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 2 | 0 |
| 1977 | 1 | 0 |
| 1978 | 1 | 0 |
| 1979 | 0 | 0 |
| 1980 | 0 | 0 |
| 1981 | 0 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 2 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 3 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 4 | 0 |
| 1993 | 5 | 0 |
| 1994 | 4 | 0 |
| 1995 | 8 | 0 |
| 1996 | 3 | 0 |
| 1997 | 6 | 0 |
| 1998 | 11 | 0 |
| 1999 | 7 | 0 |
| 2000 | 7 | 0 |
| 2001 | 6 | 1 |
| 2002 | 8 | 5 |
| 2003 | 3 | 4 |
| 2004 | 7 | 11 |
| 2005 | 5 | 2 |
| 2006 | 6 | 8 |
| 2007 | 4 | 3 |
| 2008 | 6 | 5 |
| 2009 | 1 | 7 |
| 2010 | 7 | 6 |
| 2011 | 5 | 2 |
| 2012 | 2 | 1 |
| 2013 | 3 | 3 |
| 2014 | 4 | 2 |
| 2015 | 1 | 5 |
| 2016 | 5 | 6 |
| 2017 | 10 | 5 |
| 2018 | 5 | 10 |
| 2019 | 9 | 19 |
| 2020 | 21 | 21 |
| 2021 | 21 | 21 |
| 2022 | 22 | 38 |
| 2023 | 27 | 23 |
| 2024 | 31 | 24 |
| 2025 | 18 | 21 |
| 2026 | 7 | 15 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Defect detection during erase operations18 Aug 2026US 12,712,041 B2Micron Technology, Inc.
- Bit counting circuits and memory devices including the same26 May 2026US 12,640,220 B2Samsung Electronics Co., Ltd.
- Semiconductor memory device and memory system including the same19 May 2026US 12,632,552 B2Samsung Electronics Co., Ltd.
- Usage-based disturbance mitigation counter control31 Mar 2026US 12,592,289 B2Micron Technology, Inc.
- Memory device including read offset compensator and offset reference resistance compensation method thereof24 Mar 2026US 12,586,641 B2Samsung Electronics Co., Ltd.
- Storage device and method of operating storage device20 Aug 2026US 2026/0245646 A1Samsung Electronics Co., Ltd.
- Self-calibration in a memory device16 Jul 2026US 2026/0204335 A1Micron Technology, Inc.
- Testing method for memory device18 Jun 2026US 2026/0171179 A1Powerchip Semiconductor Manufacturing Corporation
- Storage device4 Jun 2026US 2026/0155179 A1Samsung Electronics Co., Ltd.
- Internal error-checking circuit and memory4 Jun 2026US 2026/0155195 A1CXMT Corporation
Most cited
By later US patents
- Built-in self test for integrated circuit memory212US 5,138,619 ANational Semiconductor Corporation · 1992
- Memory selftest method and apparatus same102US 5,033,048 ADigital Equipment Corporation · 1991
- Method and structure for testing embedded cores based system-on-a-chip101US 6,249,893 B1Advantest Corporation · 2001
- Non-volatile memory with analog and digital interface and storage93US 5,745,409 AInvox Technology · 1998
- Tightly coupled, low overhead RAM built-in self-test logic with particular applications for embedded memories91US 5,258,986 AVLSI Technology, Inc. · 1993