G01R 31/2862
Chambers or ovens
Official title: {Chambers or ovens; Tanks}
G01R31/2862 (Chambers or ovens) appears on 240 US grants and 229 published applications in this corpus.
Search patents in G01R- Granted patents
- 240
- Published applications
- 229
- Assignees
- 155
- Inventors
- 577
- Latest grant
- 22 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 1 | 0 |
| 1986 | 1 | 0 |
| 1987 | 0 | 0 |
| 1988 | 2 | 0 |
| 1989 | 2 | 0 |
| 1990 | 5 | 0 |
| 1991 | 4 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 4 | 0 |
| 1995 | 5 | 0 |
| 1996 | 1 | 0 |
| 1997 | 1 | 0 |
| 1998 | 3 | 0 |
| 1999 | 6 | 0 |
| 2000 | 6 | 0 |
| 2001 | 7 | 2 |
| 2002 | 10 | 10 |
| 2003 | 10 | 9 |
| 2004 | 7 | 15 |
| 2005 | 9 | 11 |
| 2006 | 7 | 6 |
| 2007 | 9 | 5 |
| 2008 | 5 | 6 |
| 2009 | 6 | 6 |
| 2010 | 4 | 8 |
| 2011 | 1 | 4 |
| 2012 | 3 | 2 |
| 2013 | 3 | 2 |
| 2014 | 1 | 6 |
| 2015 | 4 | 1 |
| 2016 | 5 | 5 |
| 2017 | 2 | 6 |
| 2018 | 6 | 6 |
| 2019 | 6 | 10 |
| 2020 | 6 | 10 |
| 2021 | 13 | 20 |
| 2022 | 15 | 18 |
| 2023 | 16 | 15 |
| 2024 | 15 | 10 |
| 2025 | 10 | 19 |
| 2026 | 12 | 17 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Small device testing using thermesthesiometer22 Sep 2026US 12,742,815 B2SanDisk Technologies LLC
- Test environment control system22 Sep 2026US 12,742,816 B2Yishi Industrial Co., Ltd
- Wafer test cassette, wafer test system and wafer test method1 Sep 2026US 12,724,064 B2Xingr Technologies (Zhejiang) Limited
- Test apparatus with test chamber for burn in boards1 Sep 2026US 12,724,066 B2Samsung Electronics Co., Ltd.
- Independent thermal controller for memory devices and device interface boards11 Aug 2026US 12,704,544 B2Micron Technology, Inc.
- Probe station device8 Oct 2026US 2026/0309769 A1Korea Basic Science Institute
- Burn-in board, burn-in apparatus, and burn-in process8 Oct 2026US 2026/0309770 A1Nanya Technology Corporation
- Burn-in board, burn-in apparatus, and burn-in process8 Oct 2026US 2026/0309771 A1Nanya Technology Corporation
- Burn-in board, burn-in apparatus, and burn-in process8 Oct 2026US 2026/0309772 A1Nanya Technology Corporation
- Apparatus for testing electronic semiconductor components1 Oct 2026US 2026/0298900 A1
Most cited
By later US patents
- Environmental box for automated wafer probing195US 4,757,255 ANational Semiconductor Corporation · 1988
- Apparatus and method for burning in integrated circuit wafers177US 4,968,931 AMotorola, Inc. · 1990
- Apparatus, method and system of liquid-based, wide range, fast response temperature control of electronic device125US 6,389,225 B1Delta Design, Inc. · 2002
- Wafer scale burn-in apparatus and process103US 5,570,032 AMicron Technology, Inc. · 1996
- Apparatus for testing electrical components103US 6,113,262 ATRW Inc. · 2000