Test apparatus with test chamber for burn in boards
AssigneeSamsung Electronics Co., Ltd.
InventorsDahm Yu, Dong Ho Lee, Seon Mi Lee, Hyun-Mi Hong
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AssigneeSamsung Electronics Co., Ltd.
InventorsDahm Yu, Dong Ho Lee, Seon Mi Lee, Hyun-Mi Hong
Estimating the term…
A test apparatus includes a test chamber; a first rack supporting a plurality of first burn in boards stacked in a first direction; a second rack on top of the first rack, and configured to support a plurality of second burn in boards stacked in the first direction; and a supply duct on a first wall in the second direction of the test chamber. The supply duct includes a first flow distributor including at least one first inclined plate overlapping the plurality of first burn in boards, and extending in an inclined manner toward a bottom of the first rack. The second flow distributor includes at least one second inclined plate spaced apart from the at least one first inclined plate in the first direction, overlapping the plurality of second burn in boards in the second direction, and extending in an inclined manner toward a bottom of the second rack.
A test apparatus comprising:
A test apparatus comprising:
A test apparatus comprising:
Dependencies are inferred from the claim text.