G01R 1/07321
The probes being of different lengths
Official title: {the probes being of different lengths}
G01R1/07321 (The probes being of different lengths) appears on 17 US grants and 19 published applications in this corpus.
Search patents in G01R- Granted patents
- 17
- Published applications
- 19
- Assignees
- 19
- Inventors
- 53
- Latest grant
- 12 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1986 | 2 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 0 | 0 |
| 1991 | 0 | 0 |
| 1992 | 1 | 0 |
| 1993 | 0 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 1 | 0 |
| 1997 | 0 | 0 |
| 1998 | 0 | 0 |
| 1999 | 0 | 0 |
| 2000 | 0 | 0 |
| 2001 | 0 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 0 | 1 |
| 2005 | 0 | 0 |
| 2006 | 1 | 1 |
| 2007 | 0 | 0 |
| 2008 | 0 | 1 |
| 2009 | 0 | 2 |
| 2010 | 0 | 0 |
| 2011 | 1 | 0 |
| 2012 | 0 | 0 |
| 2013 | 1 | 0 |
| 2014 | 0 | 1 |
| 2015 | 0 | 1 |
| 2016 | 0 | 0 |
| 2017 | 1 | 0 |
| 2018 | 0 | 3 |
| 2019 | 2 | 1 |
| 2020 | 1 | 2 |
| 2021 | 1 | 1 |
| 2022 | 1 | 0 |
| 2023 | 1 | 3 |
| 2024 | 0 | 0 |
| 2025 | 1 | 1 |
| 2026 | 1 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Probe device, probe system including the probe device and operating method thereof12 May 2026US 12,625,164 B2Star Technologies Inc.
- Probe device11 Nov 2025US 12,467,951 B2Tecat Technologies (Suzhou) Limited
- Electrical connecting device and inspection method25 Jul 2023US 11,709,182 B2Kabushiki Kaisha Nihon Micronics
- Probe head6 Dec 2022US 11,519,938 B2Yokowo Co., Ltd.
- Device for measuring surface characteristics of a material21 Sep 2021US 11,125,805 B2Imec Vzw
- Testing connector30 Jul 2026US 2026/0219297 A1Isc Co., Ltd.
- Probe card structure2 Jan 2025US 2025/0004013 A1Tecat Technologies (Suzhou) Limited
- Probe device, probe system including the probe device and operating method thereof14 Dec 2023US 2023/0400480 A1Star Technologies Inc.
- Probe device26 Oct 2023US 2023/0341439 A1
- Jig for manufacturing probe card, probe alignment system comprising same, and probe card manufactured thereby8 Jun 2023US 2023/0176092 A1
Most cited
By later US patents
- Probe interface assembly86US 5,144,228 AInternational Business Machines Corporation · 1992
- Testing device for both-sided contacting of component-equipped printed circuit boards19US 4,841,241 ASiemens Aktiengesellschaft · 1989
- Vacuum actuated bi-level test fixture14US 4,625,164 APylon Company, Inc. · 1986
- Spring-stops for a bi-level test fixture11US 4,626,779 APylon Company, Inc. · 1986
- Resilient probes for electrical testing5US 7,145,354 B2Texas Instruments Incorporated · 2006