G01R 1/07314
The body of the probe being perpendicular to test object
Official title: {the body of the probe being perpendicular to test object, e.g. bed of nails or probe with bump contacts on a rigid support (on an elastic support, e.g. a film, G01R1/0735)}
G01R1/07314 (The body of the probe being perpendicular to test object) appears on 1,220 US grants and 1,005 published applications in this corpus.
Search patents in G01R- Granted patents
- 1,220
- Published applications
- 1,005
- Assignees
- 438
- Inventors
- 2,102
- Latest grant
- 29 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1976 | 5 | 0 |
| 1977 | 5 | 0 |
| 1978 | 5 | 0 |
| 1979 | 5 | 0 |
| 1980 | 5 | 0 |
| 1981 | 3 | 0 |
| 1982 | 8 | 0 |
| 1983 | 7 | 0 |
| 1984 | 3 | 0 |
| 1985 | 6 | 0 |
| 1986 | 10 | 0 |
| 1987 | 14 | 0 |
| 1988 | 10 | 0 |
| 1989 | 16 | 0 |
| 1990 | 16 | 0 |
| 1991 | 9 | 0 |
| 1992 | 17 | 0 |
| 1993 | 10 | 0 |
| 1994 | 19 | 0 |
| 1995 | 42 | 0 |
| 1996 | 35 | 0 |
| 1997 | 30 | 0 |
| 1998 | 33 | 0 |
| 1999 | 28 | 0 |
| 2000 | 29 | 0 |
| 2001 | 38 | 19 |
| 2002 | 43 | 40 |
| 2003 | 36 | 41 |
| 2004 | 39 | 54 |
| 2005 | 44 | 53 |
| 2006 | 43 | 52 |
| 2007 | 36 | 36 |
| 2008 | 42 | 37 |
| 2009 | 19 | 36 |
| 2010 | 34 | 19 |
| 2011 | 15 | 21 |
| 2012 | 15 | 13 |
| 2013 | 12 | 25 |
| 2014 | 19 | 33 |
| 2015 | 22 | 22 |
| 2016 | 23 | 26 |
| 2017 | 27 | 37 |
| 2018 | 27 | 39 |
| 2019 | 41 | 55 |
| 2020 | 48 | 49 |
| 2021 | 41 | 42 |
| 2022 | 45 | 52 |
| 2023 | 39 | 55 |
| 2024 | 40 | 63 |
| 2025 | 35 | 52 |
| 2026 | 27 | 34 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Probe assembly with downward-protruding probe shield and methods of operating the same29 Sep 2026US 12,748,131 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Probe head for loopback testing and methods of forming the same22 Sep 2026US 12,742,795 B2Taiwan Semiconductor Manufacturing Company.Ltd
- High-density implantable neural probes1 Sep 2026US 12,724,041 B2Carnegie Mellon University
- Replaceable insulator collars for semiconductor test systems18 Aug 2026US 12,710,448 B2Xcerra Corporation
- Prefabricated rubber socket11 Aug 2026US 12,704,526 B2
- Multi-prober cartridge8 Oct 2026US 2026/0309750 A1Korea Institute of Industrial Technology
- Probe head with an improved configuration24 Sep 2026US 2026/0287615 A1Technoprobe S.P.A.
- Parallel contactless testing of interposers and silicon bridges20 Aug 2026US 2026/0243821 A1Advantest Corporation
- Probe assembly for test and burn-in having a contact probe13 Aug 2026US 2026/0235644 A1Kes Systems & Service (1993) Pte Ltd.
- Testing connector30 Jul 2026US 2026/0219297 A1Isc Co., Ltd.
Most cited
By later US patents
- Sockets for electronic components and methods of connecting to electronic components453US 5,772,451 AForm Factor, Inc. · 1998
- Three dimensional high performance interconnection package422US 5,371,654 AInternational Business Machines Corporation · 1994
- Method of planarizing tips of probe elements of a probe card assembly397US 5,974,662 AFormFactor, Inc. · 1999
- Flexible contact structure with an electrically conductive shell340US 5,917,707 AFormFactor, Inc. · 1999
- Making and testing an integrated circuit using high density probe points307US 5,103,557 A1992