Probe head with an improved configuration

A probe head for testing electronic devices, comprising:

• at least one contact probe comprising a body which extends between a first end and a second end, said ends being adapted to contact respective contact pads;
• a first guide comprising respective first guide holes;
• and
• a second guide comprising respective second guide holes,
• wherein the contact probe comprises at least one intermediate section arranged between the first end and the second end said, intermediate section being elastically compliant, and
• wherein the elastically compliant intermediate section is arranged at at least one of said first guide holes and second guide holes, and wherein the contact probe further comprises intermediate stop means arranged between said first guide and said second guide, said intermediate stop means being configured to mechanically contact at least one portion of said first guide and/or said second guide for holding the contact probe inside the probe head.