Probe head for loopback testing and methods of forming the same

A probe card for a circuit probe test system, comprising:

• a substrate portion;
• and
• a probe head located below the substrate portion, the probe head comprising:
• a guide plate comprising a plurality of openings through the guide plate and a conductive trace extending between a pair of the openings;
• and
• a plurality of probe pins extending through the openings through the guide plate, wherein the plurality of probe pins comprises at least one first probe pin that forms a continuous conductive pathway along a length of the first probe pin between a tip end of the first probe pin and the substrate portion, and the plurality of probe pins comprises a pair of second probe pins that each electrically contact the conductive trace and are electrically connected by the conductive trace to form a loopback signal path, wherein each of the second probe pins does not form a continuous conductive pathway along a length of the second probe pin between a tip end of the second probe pin and the substrate portion.