Device for measuring surface characteristics of a material

A device configured to electrically measure surface characteristics of a sample, the device comprising:

• a first electrode and a second electrode, distanced apart from each other and configured to be in physical contact with a surface of a sample when the device is placed thereon;
• a third electrode, at least a portion of which is located in an area between the first electrode and the second electrode;
• one or more first dielectric portions of one or more dielectric layers disposed between the third electrode and the first and second electrodes, the one or more first dielectric portions configured to electrically isolate the third electrode from the first electrode and the second electrode;
• a second dielectric portion of the one or more dielectric layers configured to electrically isolate the third electrode from the surface of the sample when the device is placed on the surface;
• and
• one or more holders attached to an assembly comprising the first electrode, the second electrode, the third electrode, and the one or more first dielectric portions, wherein conductors are incorporated in the one or more holders and are adapted to electrically connect the first electrode, the second electrode, and the third electrode individually to a first power source or a first measurement tool, and wherein the first electrode and the second electrode are configured to extend further outward from the one or more holders and towards the surface of the sample than the third electrode to provide electrical contact with the surface of the sample.