US 4,625,164 AGranted

Vacuum actuated bi-level test fixture

AssigneePylon Company, Inc.

InventorsWillis E. Golder, Joseph A. Ierardi, Robert E. Staples, Michael C. Boyle

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Abstract

A test fixture for selectively electrically connecting an electronic circuit device for in-circuit and functional testing by automatic testing equipment. First and second pluralities of spring-loaded probes are fastened to the test fixture for respectively providing an in-circuit contact array on a first level and a functional contact array on a second level. An electronic cicuit device receiving face is mounted to the test fixture for movement to the first level for electrically connecting the electronic circuit device to the in-circuit contact array, and for movement to the second level for electrically connecting the electronic circuit device to the functional contact array. Means including a bi-level vacuum controller are disclosed for selectively moving the electronic circuit device receiving face to the first and second levels. Means coupled to the bi-level vacuum controller are disclosed for venting the test fixture to ambient during transitions from higher to lower vacuum pressures and to the unactuated condition. The bi-level vacuum controller may be locally actuated by a system operator or remotely actuated by the automatic testing equipment.

Claims9

Dependent claims

A bi-level test fixture connectable to automatic testing equipment for providing in-circuit and functional testing of an electronic circuit device, comprising:

a first plurality of spring-loaded probes having ends fastened to the test fixture for providing a first plurality of stationary signal contacts on a first level defining an in-circuit testing array;
a second plurality of spring-loaded probes having ends fastened to the test fixture for providing a second plurality of stationary signal contacts the ends of which terminate on a second level different from the first level defining a functional testing array;
an electronic circuit device receiving face;
and
means for mounting the electronic circuit device receiving face to the test fixture for movement both to the first level for electrically connecting the electronic circuit device received on the electronic circuit device receiving face to the in-circuit testing array for in-circuit testing by the automatic testing equipment, and for movement to the second level for electrically connecting the electronic circuit device received on the electronic circuit device receiving face to the functional testing array for functional testing by the automatic testing equipment.

2 more elements

Dependencies are inferred from the claim text.