G01R 1/0466
Concerning contact pieces or mechanical details
Official title: {concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding}
G01R1/0466 (Concerning contact pieces or mechanical details) appears on 964 US grants and 970 published applications in this corpus.
Search patents in G01R- Granted patents
- 964
- Published applications
- 970
- Assignees
- 317
- Inventors
- 1,464
- Latest grant
- 15 Sep 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1981 | 1 | 0 |
| 1982 | 0 | 0 |
| 1983 | 1 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 0 | 0 |
| 1987 | 0 | 0 |
| 1988 | 0 | 0 |
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 2 | 0 |
| 1992 | 3 | 0 |
| 1993 | 2 | 0 |
| 1994 | 6 | 0 |
| 1995 | 5 | 0 |
| 1996 | 12 | 0 |
| 1997 | 15 | 0 |
| 1998 | 12 | 0 |
| 1999 | 21 | 0 |
| 2000 | 20 | 0 |
| 2001 | 37 | 16 |
| 2002 | 34 | 26 |
| 2003 | 36 | 45 |
| 2004 | 32 | 34 |
| 2005 | 41 | 43 |
| 2006 | 48 | 49 |
| 2007 | 42 | 44 |
| 2008 | 24 | 32 |
| 2009 | 29 | 40 |
| 2010 | 37 | 39 |
| 2011 | 37 | 27 |
| 2012 | 16 | 26 |
| 2013 | 21 | 27 |
| 2014 | 8 | 30 |
| 2015 | 32 | 46 |
| 2016 | 32 | 30 |
| 2017 | 34 | 21 |
| 2018 | 26 | 31 |
| 2019 | 32 | 42 |
| 2020 | 38 | 41 |
| 2021 | 39 | 42 |
| 2022 | 40 | 45 |
| 2023 | 45 | 55 |
| 2024 | 39 | 53 |
| 2025 | 38 | 38 |
| 2026 | 24 | 48 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Test socket for 224GBPS ultra-high-speed coaxial testing15 Sep 2026US 12,736,559 B2Solaris Nanofab Ltd.
- Device handling apparatus and device testing apparatus15 Sep 2026US 12,736,582 B2Advantest Corporation
- Low profile electronic testing system with flexible test PCB format25 Aug 2026US 12,716,913 B2Modus Test, LLC
- Contact pin and test socket having the same25 Aug 2026US 12,716,914 B2LST Corporation
- Socket for testing semiconductor device18 Aug 2026US 12,710,446 B2Samsung Electronics Co., Ltd.
- Fixture device, testing system, and positioning rod for integrated circuit substrate testing8 Oct 2026US 2026/0309747 A1Mpi Corporation
- High temperature and high current non-zero insertion force spring contact receptacle for dut sockets1 Oct 2026US 2026/0298976 A1
- Testing device and method for testing an electronic device17 Sep 2026US 2026/0276701 A1JCET STATS ChipPAC Korea Limited
- Testing connector30 Jul 2026US 2026/0219297 A1Isc Co., Ltd.
- Semiconductor test device and semiconductor test system23 Jul 2026US 2026/0211001 A1Olum Material Corporation
Most cited
By later US patents
- Method of manufacturing electrical contacts, using a sacrificial member437US 5,476,211 AForm Factor, Inc. · 1995
- Flexible contact structure with an electrically conductive shell340US 5,917,707 AFormFactor, Inc. · 1999
- Methods of assembling microelectronic assembly with socket for engaging bump leads327US 5,802,699 ATessera, Inc. · 1998
- Method for forming an interconnect having a penetration limited contact structure for establishing a temporary electrical connection with a semiconductor die241US 5,686,317 AMicron Technology, Inc. · 1997
- Soldering with resilient contacts217US 5,980,270 ATessera, Inc. · 1999