Low profile electronic testing system with flexible test PCB format

A testing system for flexibly testing different devices, comprising:

• a housing;
• the housing forming a hollow interior;
• a first circuit board positioned within the hollow interior;
• the first circuit board having test circuitry for testing electrical connections of a device under test (DUT);
• the first circuit board having a first set of electrical contacts electrically connected to the test circuitry;
• a receiver assembly operably connected to the housing;
• the receiver assembly configured to receive and hold a second circuit board;
• the second circuit board having a socket configured to receive and hold the DUT;
• the second circuit board having a second set of electrical contacts;
• wherein when the DUT is held within the socket the DUT is electrically connected to the second set of electrical contacts;
• wherein when the second circuit board is held within the receiver assembly, the second set of electrical contacts are electrically connected with the first set of electrical contacts, thereby electrically connecting the test circuitry with the DUT for testing,
• wherein the receiver assembly includes at least one clamp;
• wherein the at least one clamp includes a clamping plate assembly operably connected to a handle;
• wherein when the handle is raised, the clamping plate assembly is raised to an unclamped position;
• wherein when the handle is lowered, the clamping plate assembly is lowered to a clamped position;
• wherein when in the clamped position, the clamping plate assembly places a downward force on the second circuit board.

A testing system for flexibly testing different devices, comprising:

• a housing;
• the housing forming a hollow interior;
• a first circuit board positioned within the hollow interior;
• the first circuit board having test circuitry for testing electrical connections of a device under test (DUT);
• the first circuit board having a first set of electrical contacts electrically connected to the test circuitry;
• a receiver assembly operably connected to the housing;
• the receiver assembly configured to receive and hold a second circuit board;
• the second circuit board having a socket configured to receive and hold the DUT;
• the second circuit board having a second set of electrical contacts;
• wherein when the DUT is held within the socket the DUT is electrically connected to the second set of electrical contacts;
• wherein when the second circuit board is held within the receiver assembly, the second set of electrical contacts are electrically connected with the first set of electrical contacts, thereby electrically connecting the test circuitry with the DUT for testing;
• wherein the receiver assembly includes at least one clamp;
• wherein the at least one clamp includes a lever extending between an inner end and an outer end;
• wherein the at least one clamp includes a clamping plate assembly operably connected to the inner end of the lever;
• wherein the at least one clamp includes a handle operably connected to the outer end of the lever;
• wherein when the handle is raised, the lever raises the clamping plate assembly to an unclamped position;
• wherein when the handle is lowered, the lever lowers the clamping plate assembly to a clamped position;
• wherein when in the clamped position, the clamping plate assembly places a downward force on the second circuit board.

A testing system for flexibly testing different devices, comprising:

• a housing;
• the housing forming a hollow interior;
• a first circuit board positioned within the hollow interior;
• the first circuit board having test circuitry for testing electrical connections of a device under test (DUT);
• the first circuit board having a first set of electrical contacts electrically connected to the test circuitry;
• a receiver assembly operably connected to the housing;
• the receiver assembly configured to receive and hold a second circuit board;
• the second circuit board having a socket configured to receive and hold the DUT;
• the second circuit board having a second set of electrical contacts;
• wherein when the DUT is held within the socket the DUT is electrically connected to the second set of electrical contacts;
• wherein when the second circuit board is held within the receiver assembly, the second set of electrical contacts are electrically connected with the first set of electrical contacts, thereby electrically connecting the test circuitry with the DUT for testing;
• wherein the receiver assembly includes a window formed in a top of the housing;
• wherein the receiver assembly includes a pair of clamps positioned on opposing sides of the window;
• wherein the pair of clamps are movable laterally between an inward position and an outward position;
• wherein when the pair of clamps are in the inward position the clamps cover a portion of the window;
• wherein when the pair of clamps are in the outward position, the window is uncovered.

A flat form factor and flexible PCB testing system, comprising:

• a housing;
• the housing forming a hollow interior;
• a first circuit board positioned within the hollow interior;
• the first circuit board having test circuitry for testing electrical connections of a device under test (DUT);
• a receiver assembly operably connected to the housing;
• the receiver assembly configured to receive and hold a second circuit board;
• the second circuit board having a socket configured to receive and hold the DUT;
• wherein when the second circuit board is held within the receiver assembly, the second circuit board electrically connects the test circuitry of the first circuit board with the DUT for testing,
• wherein the receiver assembly includes at least one clamp;
• wherein the at least one clamp includes a clamping plate assembly operably connected to a handle;
• wherein when the handle is raised, the clamping plate assembly is raised to an unclamped position;
• wherein when the handle is lowered, the clamping plate assembly is lowered to a clamped position;
• wherein when in the clamped position, the clamping plate assembly places a downward force on the second circuit board.

A flexible PCB testing system, comprising:

• a housing;
• the housing forming a hollow interior;
• a first circuit board positioned within the hollow interior;
• the first circuit board having test circuitry for testing electrical connections of a device under test (DUT);
• a receiver assembly operably connected to the housing;
• the receiver assembly configured to receive and hold a second circuit board;
• the second circuit board having a socket configured to receive and hold the DUT;
• wherein when the second circuit board is held within the receiver assembly, the second circuit board electrically connects the test circuitry of the first circuit board with the DUT for testing;
• wherein the test circuitry is configured to evaluate a set of performance parameters of the DUT;
• wherein the receiver assembly includes at least one clamp,
• wherein the at least one clamp includes a clamping plate assembly operably connected to a handle;
• wherein when the handle is raised, the clamping plate assembly is raised to an unclamped position;
• wherein when the handle is lowered, the clamping plate assembly is lowered to a clamped position;
• wherein when in the clamped position, the clamping plate assembly places a downward force on the second circuit board.