Fixture device, testing system, and positioning rod for integrated circuit substrate testing

A fixture device for integrated circuit substrate testing, which is adapted to clamp a substrate, the substrate comprising an upper surface and a lower surface, the lower surface comprising a tested contact region and a non-tested contact region, the fixture device comprising:

• a base defined with a length axis, a width axis, and a height axis, which are perpendicular to each other;
• and
• two positioning rods, each of the positioning rods being disposed on the base so as to extend along the length axis, at least one of the two positioning rods being a slidable positioning rod, the slidable positioning rod being changeable between a slidable state and a fixed state, the slidable positioning rod in the slidable state being slidable relative to the base along the width axis for adapting to a width of the substrate, the slidable positioning rod in the fixed state being fixed to the base so that the substrate is fixedly clamped by the two positioning rods;
• wherein each of the positioning rods comprises a top surface and a bottom surface, which face toward two opposite directions of the height axis respectively, and a main step formed downward into a step shape from an edge of the top surface;
• the main step comprises a clamping surface adjacent to the top surface, and a supporting surface adjacent to the clamping surface;
• the clamping surfaces of the main steps of the two positioning rods face each other, and at least one of the clamping surfaces is formed from an resilient material, such that the two positioning rods are arranged in a way that the clamping surfaces of the main steps of the two positioning rods are adapted to cooperatively clamp the substrate, the supporting surfaces of the main steps of the two positioning rods are adapted to cooperatively support the non-tested contact region of the lower surface of the substrate, and the two positioning rods are provided therebetween with a gap extending along the length axis and located between the tested contact region of the lower surface of the substrate and the base.