G01Q 60/40
Conductive probes
G01Q60/40 (Conductive probes) appears on 102 US grants and 82 published applications in this corpus.
Search patents in G01Q- Granted patents
- 102
- Published applications
- 82
- Assignees
- 94
- Inventors
- 303
- Latest grant
- 24 Mar 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1992 | 1 | 0 |
| 1993 | 3 | 0 |
| 1994 | 1 | 0 |
| 1995 | 4 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 4 | 0 |
| 2000 | 6 | 0 |
| 2001 | 2 | 0 |
| 2002 | 3 | 4 |
| 2003 | 1 | 2 |
| 2004 | 2 | 0 |
| 2005 | 1 | 5 |
| 2006 | 5 | 5 |
| 2007 | 4 | 3 |
| 2008 | 4 | 3 |
| 2009 | 2 | 4 |
| 2010 | 3 | 5 |
| 2011 | 1 | 2 |
| 2012 | 4 | 5 |
| 2013 | 6 | 5 |
| 2014 | 7 | 1 |
| 2015 | 3 | 5 |
| 2016 | 4 | 1 |
| 2017 | 1 | 0 |
| 2018 | 1 | 3 |
| 2019 | 1 | 1 |
| 2020 | 3 | 3 |
| 2021 | 6 | 4 |
| 2022 | 4 | 3 |
| 2023 | 2 | 3 |
| 2024 | 4 | 6 |
| 2025 | 3 | 5 |
| 2026 | 1 | 4 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Measurement system with detection mechanism and method of operation thereof24 Mar 2026US 12,584,942 B1Park Systems Corp.
- Method and apparatus for measuring electrical properties of sample material, device and medium16 Sep 2025US 12,416,657 B2Beijing Institute of Nanoenergy and Nanosystems
- Manufacturing process with atomic level inspection9 Sep 2025US 12,412,787 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Detection systems in semiconductor metrology tools29 Jul 2025US 12,374,522 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Probe tip X-Y location identification using a charged particle beam17 Dec 2024US 12,169,208 B2Innovatum Instruments Inc.
- System and method for automatically loading and testing afm-probes30 Jul 2026US 2026/0219295 A1Nearfield Instruments B.V.
- Scanning and micro-mass imaging technology using probe28 May 2026US 2026/0147014 A1Nanchang Hangkong University
- Method for detecting semiconductor carriers using a nanometer-scale microwave probe integrated with an atomic force microscope7 May 2026US 2026/0126468 A1National Cheng Kung University
- Cantilevered scanning probe quantum sensor and applications of the same26 Mar 2026US 2026/0086111 A1University of Maryland, College Park
- Measurement system and measurement method25 Dec 2025US 2025/0389751 A1Gtheranostics Co., Ltd.
Most cited
By later US patents
- Force sensing probe for scanning probe microscopy602US 6,121,611 AArizona Board of Regents · 2000
- Double cantilever sensor for atomic force microscope104US 5,267,471 AIBM Corporation · 1993
- Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements78US 6,339,217 B12002
- Cantilever and measuring apparatus using it67US 5,929,438 ANikon Corporation · 1999
- Microfabrication of cantilevers using sacrificial templates63US 6,016,693 AThe Regents of the University of California · 2000