G01Q 60/24
Afm [atomic force microscopy] or apparatus therefor
Official title: AFM [Atomic Force Microscopy] or apparatus therefor, e.g. AFM probes
G01Q60/24 (Afm [atomic force microscopy] or apparatus therefor) appears on 1,268 US grants and 1,175 published applications in this corpus.
Search patents in G01Q- Granted patents
- 1,268
- Published applications
- 1,175
- Assignees
- 599
- Inventors
- 2,501
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1988 | 1 | 0 |
| 1989 | 4 | 0 |
| 1990 | 3 | 0 |
| 1991 | 5 | 0 |
| 1992 | 2 | 0 |
| 1993 | 20 | 0 |
| 1994 | 24 | 0 |
| 1995 | 25 | 0 |
| 1996 | 23 | 0 |
| 1997 | 23 | 0 |
| 1998 | 29 | 0 |
| 1999 | 40 | 0 |
| 2000 | 30 | 0 |
| 2001 | 29 | 5 |
| 2002 | 25 | 25 |
| 2003 | 20 | 33 |
| 2004 | 29 | 26 |
| 2005 | 22 | 48 |
| 2006 | 42 | 60 |
| 2007 | 33 | 59 |
| 2008 | 51 | 70 |
| 2009 | 41 | 57 |
| 2010 | 50 | 57 |
| 2011 | 47 | 44 |
| 2012 | 37 | 42 |
| 2013 | 54 | 53 |
| 2014 | 58 | 48 |
| 2015 | 41 | 51 |
| 2016 | 42 | 56 |
| 2017 | 43 | 38 |
| 2018 | 50 | 48 |
| 2019 | 39 | 62 |
| 2020 | 60 | 48 |
| 2021 | 57 | 56 |
| 2022 | 40 | 52 |
| 2023 | 55 | 40 |
| 2024 | 30 | 34 |
| 2025 | 24 | 39 |
| 2026 | 20 | 24 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Decoupled optical force nanoscopy6 Oct 2026US 12,754,207 B2The Board of Trustees of the University of Illinois
- Method of removing and collecting particles from photomask and device for removing and collecting particles therefrom6 Oct 2026US 12,754,208 B2Samsung Electronics Co., Ltd.
- In situ mechanical characterization of a sample strain29 Sep 2026US 12,748,129 B2NUtech Ventures
- Method of removing defect of mask15 Sep 2026US 12,736,870 B2Samsung Electronics Co., Ltd.
- Atomic force microscope (AFM) device and method of operating the same8 Sep 2026US 12,730,127 B2Nearfield Instruments B.V.
- Method for evaluating corrosion resistance of aluminum sheet1 Oct 2026US 2026/0298799 A1Honda Motor Co., Ltd.
- Afm device and method1 Oct 2026US 2026/0298972 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Multi-probe atomic force microscopy rotator24 Sep 2026US 2026/0287611 A1Laser Thermal Analysis, Inc.
- Multi-head afm for defect inspection and review24 Sep 2026US 2026/0287612 A1Nearfield Instruments B.V.
- Device for imaging and electrochemical sensing17 Sep 2026US 2026/0276574 A1The Board of Trustees of The University of Alabama
Most cited
By later US patents
- Force sensing probe for scanning probe microscopy602US 6,121,611 AArizona Board of Regents · 2000
- Atomic force microscope and method for imaging surfaces with atomic resolution171US 4,724,318 AInternational Business Machines Corporation · 1988
- Multi-dimensional capacitive transducer146US 5,869,751 AHysitron, Inc. · 1999
- Tapping atomic force microscope140US 5,412,980 ADigital Instruments, Inc. · 1995
- Near field scanning optical and force microscope including cantilever and optical waveguide136US 5,354,985 AStanford University · 1994