G01Q 60/36
Dc mode
Official title: DC mode
G01Q60/36 (Dc mode) appears on 119 US grants and 115 published applications in this corpus.
Search patents in G01Q- Granted patents
- 119
- Published applications
- 115
- Assignees
- 77
- Inventors
- 280
- Latest grant
- 16 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 2 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 3 | 0 |
| 2001 | 0 | 0 |
| 2002 | 2 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 1 | 4 |
| 2006 | 3 | 2 |
| 2007 | 1 | 3 |
| 2008 | 2 | 3 |
| 2009 | 1 | 5 |
| 2010 | 7 | 7 |
| 2011 | 4 | 7 |
| 2012 | 3 | 5 |
| 2013 | 6 | 13 |
| 2014 | 9 | 9 |
| 2015 | 8 | 7 |
| 2016 | 9 | 4 |
| 2017 | 5 | 2 |
| 2018 | 5 | 2 |
| 2019 | 3 | 7 |
| 2020 | 6 | 3 |
| 2021 | 3 | 8 |
| 2022 | 13 | 9 |
| 2023 | 5 | 4 |
| 2024 | 5 | 5 |
| 2025 | 4 | 4 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Indentation head for an indentation instrument16 Jun 2026US 12,656,233 B2Anton Paar Tritec SA
- Methods of producing single photon emitters on substrates, and devices, and chips10 Mar 2026US 12,575,225 B2Purdue Research Foundation
- Method, system and computer program for performing acoustic scanning probe microscopy1 Jul 2025US 12,345,737 B2Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Active bimodal AFM operation for measurements of optical interaction8 Apr 2025US 12,270,827 B2Attocube Systems AG
- Nanoscale dynamic mechanical analysis via atomic force microscopy (AFM-nDMA)4 Mar 2025US 12,241,911 B2Bruker Nano, Inc.
- Methods of producing single photon emitters on substrates, and devices, and chips7 May 2026US 2026/0130011 A1Purdue Research Foundation
- Method of and scanning probe microscopy system for measuring a topography of a side wall of a structure on a surface of a substrate18 Dec 2025US 2025/0383369 A1Nearfield Instruments B.V.
- Controlled Indentation Instrumentation Working in Dynamical Mechanical Analysis Mode4 Dec 2025US 2025/0370002 A1
- Probes, apparatuses and methods for use in scanning probe microscopy26 Jun 2025US 2025/0208163 A1Yeda Research and Development Co. Ltd.
- Nanoscale Dynamic Mechanical Analysis Via Atomic Force Microscopy (AFM-nDMA)8 May 2025US 2025/0147066 A1Bruker Nano, Inc.
Most cited
By later US patents
- Multi-dimensional capacitive transducer146US 5,869,751 AHysitron, Inc. · 1999
- Apparatus for microindentation hardness testing and surface imaging incorporating a multi-plate capacitor system65US 5,553,486 AHysitron, Inc. · 1996
- Multi-dimensional capacitive transducer52US 5,661,235 AHysitron, Inc. · 1997
- Dual cantilever scanning probe microscope46US 6,028,305 AThe Board of Trustees of the Leland Stanford Jr. University · 2000
- Atomic force microscope42US 5,224,376 ADigital Instruments, Inc. · 1993