6,843 results
PatentTitle and first matching claimMatch
- US 2026/0318947 A1Published 15 Oct 2026Scanning microwave microscopy using a mediator layer
Eidgenoessisches Inst Fuer Metrologie Metas
- US 12,761,242 B2Granted 13 Oct 2026
- US 12,761,241 B2Granted 13 Oct 2026Scanning probe microscopy system and method of operating such a system
Nearfield Instruments B.V.
- US 2026/0309746 A1Published 8 Oct 2026
- US 2026/0309745 A1Published 8 Oct 2026Holding Device and Method for Probe Microscopy and Optical Methods
Bruker Nano, Inc.
- US 2026/0309744 A1Published 8 Oct 2026
- US 12,754,208 B2Granted 6 Oct 2026
- US 12,754,207 B2Granted 6 Oct 2026Decoupled optical force nanoscopy
The Board of Trustees of the University of Illinois
- US 2026/0298972 A1Published 1 Oct 2026Afm device and method
Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- US 2026/0298799 A1Published 1 Oct 2026Method for evaluating corrosion resistance of aluminum sheet
Honda Motor Co., Ltd.
- US 12,748,129 B2Granted 29 Sep 2026In situ mechanical characterization of a sample strain
NUtech Ventures
- US 12,748,128 B2Granted 29 Sep 2026Microscopy imaging
Alentic Microscience Inc.
- US 2026/0287612 A1Published 24 Sep 2026Multi-head afm for defect inspection and review
Nearfield Instruments B.V.
- US 2026/0287611 A1Published 24 Sep 2026Multi-probe atomic force microscopy rotator
Laser Thermal Analysis, Inc.
- US 2026/0287509 A1Published 24 Sep 2026Method for measuring cellular mechanics in an in vitro fibrosis model
National Cheng Kung University
- US 2026/0277119 A1Published 17 Sep 2026Computer-implemented method and apparatus for processing a sample with a nanomanipulator
Christof Baur, Markus Waiblinger +1inventors
- US 2026/0276672 A1Published 17 Sep 2026Nano-Probe Thermoreflectance Microscopy
Laser Thermal Analysis, Inc.
- US 2026/0276574 A1Published 17 Sep 2026Device for imaging and electrochemical sensing
The Board of Trustees of The University of Alabama
- US 12,736,870 B2Granted 15 Sep 2026Method of removing defect of mask
Samsung Electronics Co., Ltd.
- US 2026/0269176 A1Published 10 Sep 2026
- US 2026/0266868 A1Published 10 Sep 2026Machine-Learning Based Methods of Probe Microscopy
Infinitesima Limited
- US 2026/0266867 A1Published 10 Sep 2026Computer-implemented method and apparatus for processing a sample using a nanomanipulator
Christof Baur, Katharina Eberl +1inventors
- US 12,730,127 B2Granted 8 Sep 2026Atomic force microscope (AFM) device and method of operating the same
Nearfield Instruments B.V.
- US 2026/0259247 A1Published 3 Sep 2026
- US 12,724,038 B2Granted 1 Sep 2026Grid plate encoder based positioning system and method
Nearfield Instruments B.V.