G01Q 60/00
Particular types of spm [scanning probe microscopy] or microscopes
Official title: Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof
G01Q60/00 (Particular types of spm [scanning probe microscopy] or microscopes) appears on 2,234 US grants and 1,826 published applications in this corpus.
Search patents in G01Q- Granted patents
- 2,234
- Published applications
- 1,826
- Assignees
- 875
- Inventors
- 4,115
- Latest grant
- 6 Oct 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1982 | 1 | 0 |
| 1983 | 0 | 0 |
| 1984 | 1 | 0 |
| 1985 | 0 | 0 |
| 1986 | 1 | 0 |
| 1987 | 3 | 0 |
| 1988 | 4 | 0 |
| 1989 | 17 | 0 |
| 1990 | 21 | 0 |
| 1991 | 32 | 0 |
| 1992 | 27 | 0 |
| 1993 | 46 | 0 |
| 1994 | 57 | 0 |
| 1995 | 49 | 0 |
| 1996 | 47 | 0 |
| 1997 | 55 | 0 |
| 1998 | 53 | 0 |
| 1999 | 78 | 0 |
| 2000 | 51 | 0 |
| 2001 | 62 | 13 |
| 2002 | 59 | 58 |
| 2003 | 58 | 73 |
| 2004 | 65 | 59 |
| 2005 | 57 | 86 |
| 2006 | 81 | 107 |
| 2007 | 64 | 91 |
| 2008 | 79 | 96 |
| 2009 | 72 | 90 |
| 2010 | 77 | 95 |
| 2011 | 68 | 71 |
| 2012 | 68 | 68 |
| 2013 | 82 | 75 |
| 2014 | 87 | 71 |
| 2015 | 59 | 76 |
| 2016 | 68 | 79 |
| 2017 | 62 | 58 |
| 2018 | 67 | 79 |
| 2019 | 70 | 82 |
| 2020 | 81 | 63 |
| 2021 | 73 | 80 |
| 2022 | 51 | 68 |
| 2023 | 74 | 53 |
| 2024 | 43 | 51 |
| 2025 | 38 | 52 |
| 2026 | 26 | 32 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
- G01Q 60/24Afm [atomic force microscopy] or apparatus therefor1,268
- G01Q 60/18Snom [scanning near-field optical microscopy] or apparatus therefor538
- G01Q 60/10Stm [scanning tunnelling microscopy] or apparatus therefor304
- G01Q 60/02Multiple-type spm, i.e. involving more than one spm techniques191
- G01Q 60/50Mfm [magnetic force microscopy] or apparatus therefor138
- G01Q 60/58Sthm [scanning thermal microscopy] or apparatus therefor75
- G01Q 60/60Secm [scanning electro-chemical microscopy] or apparatus therefor37
- G01Q 60/46Scm [scanning capacitance microscopy] or apparatus therefor33
All 9 subgroupsShow fewer
Recent patents
- Decoupled optical force nanoscopy6 Oct 2026US 12,754,207 B2The Board of Trustees of the University of Illinois
- Method of removing and collecting particles from photomask and device for removing and collecting particles therefrom6 Oct 2026US 12,754,208 B2Samsung Electronics Co., Ltd.
- Microscopy imaging29 Sep 2026US 12,748,128 B2Alentic Microscience Inc.
- In situ mechanical characterization of a sample strain29 Sep 2026US 12,748,129 B2NUtech Ventures
- Method of removing defect of mask15 Sep 2026US 12,736,870 B2Samsung Electronics Co., Ltd.
- Method for evaluating corrosion resistance of aluminum sheet1 Oct 2026US 2026/0298799 A1Honda Motor Co., Ltd.
- Afm device and method1 Oct 2026US 2026/0298972 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Multi-probe atomic force microscopy rotator24 Sep 2026US 2026/0287611 A1Laser Thermal Analysis, Inc.
- Multi-head afm for defect inspection and review24 Sep 2026US 2026/0287612 A1Nearfield Instruments B.V.
- Device for imaging and electrochemical sensing17 Sep 2026US 2026/0276574 A1The Board of Trustees of The University of Alabama
Most cited
By later US patents
- Force sensing probe for scanning probe microscopy602US 6,121,611 AArizona Board of Regents · 2000
- Zero-mode clad waveguides for performing spectroscopy with confined effective observation volumes483US 6,917,726 B2Cornell Research Foundation, Inc. · 2005
- Superresolution imaging fiber for subwavelength light energy generation and near-field optical microscopy253US 5,633,972 ATrustees of Tufts College · 1997
- Near-field scanning optical microscope using a fluorescent probe244US 5,105,305 AAT&T Bell Laboratories · 1992
- Scanning tunneling microscope200US 4,343,993 AInternational Business Machines Corporation · 1982