G01Q 60/02
Multiple-type spm, i.e. involving more than one spm techniques
Official title: Multiple-type SPM, i.e. involving more than one SPM techniques
G01Q60/02 (Multiple-type spm, i.e. involving more than one spm techniques) appears on 191 US grants and 126 published applications in this corpus.
Search patents in G01Q- Granted patents
- 191
- Published applications
- 126
- Assignees
- 122
- Inventors
- 396
- Latest grant
- 7 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 2 | 0 |
| 1991 | 1 | 0 |
| 1992 | 6 | 0 |
| 1993 | 4 | 0 |
| 1994 | 10 | 0 |
| 1995 | 5 | 0 |
| 1996 | 4 | 0 |
| 1997 | 5 | 0 |
| 1998 | 6 | 0 |
| 1999 | 7 | 0 |
| 2000 | 7 | 0 |
| 2001 | 10 | 3 |
| 2002 | 10 | 4 |
| 2003 | 2 | 1 |
| 2004 | 5 | 2 |
| 2005 | 4 | 6 |
| 2006 | 5 | 6 |
| 2007 | 6 | 7 |
| 2008 | 6 | 8 |
| 2009 | 6 | 2 |
| 2010 | 4 | 8 |
| 2011 | 1 | 3 |
| 2012 | 3 | 5 |
| 2013 | 7 | 4 |
| 2014 | 11 | 8 |
| 2015 | 4 | 6 |
| 2016 | 6 | 8 |
| 2017 | 5 | 6 |
| 2018 | 4 | 5 |
| 2019 | 3 | 2 |
| 2020 | 6 | 8 |
| 2021 | 6 | 7 |
| 2022 | 2 | 6 |
| 2023 | 8 | 4 |
| 2024 | 4 | 5 |
| 2025 | 4 | 2 |
| 2026 | 2 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- Method and apparatus for measuring magnetic field strength26 May 2026US 12,638,522 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Hybrid near-field scanning microwave microscope18 Nov 2025US 12,474,369 B2Universidade De Aveiro
- Micro-optomechanical system and method for the production thereof22 Apr 2025US 12,282,040 B2Karlsruher Institut für Technologie
- Method of examining a sample in a scanning tunneling microscope using tip-to-sample distance variations18 Mar 2025US 12,253,538 B2Ceske Vysoke Uceni Technicke V Praze
- Hybrid near-field scanning microwave microscope28 Aug 2025US 2025/0271465 A1Universidade De Aveiro
- Method and apparatus for scattering-type scanning near-field optical microscopy (s-snom)27 Feb 2025US 2025/0067770 A1Humboldt-Universitaet zu Berlin
- Scattering-type scanning near-field optical microscopy with akiyama piezo-probes15 Aug 2024US 2024/0272196 A1The Research Foundation for The State University of New York
- A method of examining a sample in a scanning tunneling microscope using tip-to-tip sample distance variations8 Aug 2024US 2024/0264198 A1Ceske Vysoke Uceni Technicke V Praze
- Tip-enhanced spectroscopy11 Jul 2024US 2024/0230520 A1Postech Research and Business Development Foundation
Most cited
By later US patents
- High resolution scanning raman microscope149US 6,002,471 ACalifornia Institute of Technology · 1999
- Near field scanning optical and force microscope including cantilever and optical waveguide136US 5,354,985 AStanford University · 1994
- Scanning probe microscope assembly and method for making confocal, spectrophotometric, near-field, and scanning probe measurements and associated images114US 6,232,597 B1General Nanotechnology LLC · 2001
- Scanning microscope comprising force-sensing means and position-sensitive photodetector95US 5,254,854 AAT&T Bell Laboratories · 1993
- Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light93US 5,289,004 AOlympus Optical Co., Ltd. · 1994