G01Q 60/04
Stm [scanning tunnelling microscopy] combined with afm [atomic force microscopy]
Official title: STM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]
G01Q60/04 (Stm [scanning tunnelling microscopy] combined with afm [atomic force microscopy]) appears on 49 US grants and 25 published applications in this corpus.
Search patents in G01Q- Granted patents
- 49
- Published applications
- 25
- Assignees
- 36
- Inventors
- 94
- Latest grant
- 18 Mar 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 4 | 0 |
| 1993 | 1 | 0 |
| 1994 | 7 | 0 |
| 1995 | 3 | 0 |
| 1996 | 2 | 0 |
| 1997 | 1 | 0 |
| 1998 | 2 | 0 |
| 1999 | 2 | 0 |
| 2000 | 3 | 0 |
| 2001 | 2 | 0 |
| 2002 | 2 | 3 |
| 2003 | 0 | 0 |
| 2004 | 1 | 0 |
| 2005 | 1 | 3 |
| 2006 | 3 | 3 |
| 2007 | 1 | 2 |
| 2008 | 2 | 5 |
| 2009 | 3 | 0 |
| 2010 | 1 | 1 |
| 2011 | 0 | 0 |
| 2012 | 1 | 1 |
| 2013 | 2 | 0 |
| 2014 | 0 | 0 |
| 2015 | 0 | 1 |
| 2016 | 1 | 2 |
| 2017 | 0 | 0 |
| 2018 | 0 | 0 |
| 2019 | 0 | 1 |
| 2020 | 1 | 1 |
| 2021 | 1 | 0 |
| 2022 | 0 | 0 |
| 2023 | 0 | 0 |
| 2024 | 0 | 2 |
| 2025 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Method of examining a sample in a scanning tunneling microscope using tip-to-sample distance variations18 Mar 2025US 12,253,538 B2Ceske Vysoke Uceni Technicke V Praze
- Multiple integrated tips scanning probe microscope19 Jan 2021US 10,895,585 B2Xallent, LLC
- Multiple integrated tips scanning probe microscope7 Apr 2020US 10,613,115 B2Xallent, LLC
- Microscope having a multimode local probe, tip-enhanced raman microscope, and method for controlling the distance between the local probe and the sample14 Jun 2016US 9,366,694 B2Centre National De La Recherche Scientifique
- Scanning probe microscopy inspection and modification system6 Aug 2013US 8,499,621 B2
- A method of examining a sample in a scanning tunneling microscope using tip-to-tip sample distance variations8 Aug 2024US 2024/0264198 A1Ceske Vysoke Uceni Technicke V Praze
- Device for measuring and/or modifying a surface11 Apr 2024US 2024/0118310 A1Centre National de la Recherche Scientifique (CNRS)
- Multiple integrated tips scanning probe microscope18 Jun 2020US 2020/0191827 A1Xallent, LLC
- Multiple integrated tips scanning probe microscope2 May 2019US 2019/0128919 A1Xallent, LLC
- Multiple Integrated Tips Scanning Probe Microscope1 Sep 2016US 2016/0252545 A1Xallent, LLC
Most cited
By later US patents
- Scanning probe microscope having cantilever and detecting sample characteristics by means of reflected sample examination light93US 5,289,004 AOlympus Optical Co., Ltd. · 1994
- Object inspection and/or modification system and method89US 6,337,479 B12002
- Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements78US 6,339,217 B12002
- Method for identifying biochemical and chemical reactions and micromechanical processes using nanomechanical and electronic signal identification71US 5,620,854 AThe Regents of the University of California · 1997
- Micro-displacement type information detection probe device and scanning tunneling microscope, atomic force microscope, information processing device by use thereof66US 5,276,672 ACanon Kabushiki Kaisha · 1994