US 6,339,217 B1 · Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements

Abstract

A scanning probe microscope assembly (100) that has an atomic force measurement (AFM) mode (137), a scanning tunneling measurement (STM) mode (138), a near-field spectrophotometry mode (143), a near-field optical mode (151), and a hardness testing mode 195 for examining an object.

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Dependent claims

Claims aren’t available for this document.

Facts

Application

08/776,361Filed 16 May 1997

Granted

15 Jan 2002

Term ends

Not estimatedThe source records don’t support an estimate.

Classification21 codes

G01Q 60/02
Particular types of SPM [Scanning Probe Microscopy] or microscopes; Essential components thereof: multiple-type SPM, i.e. involving more than one…
G01Q 20/02
Monitoring the movement or position of the probe: by optical means
G01Q 30/02
Auxiliary means serving to assist or improve the scanning probe techniques or apparatus, e.g. display or data processing devices: non-SPM…
G01Q 60/04
Multiple-type SPM, i.e. involving more than one SPM techniques: sTM [Scanning Tunnelling Microscopy] combined with AFM [Atomic Force Microscopy]

Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements

Life of this patent

Abstract

Claims0

Scanning probe microscope assembly and method for making spectrophotometric, near-field, and scanning probe measurements

Life of this patent

Abstract

Claims0