G01Q 60/06
Snom [scanning near-field optical microscopy] combined with afm [atomic force microscopy]
Official title: SNOM [Scanning Near-field Optical Microscopy] combined with AFM [Atomic Force Microscopy]
G01Q60/06 (Snom [scanning near-field optical microscopy] combined with afm [atomic force microscopy]) appears on 68 US grants and 51 published applications in this corpus.
Search patents in G01Q- Granted patents
- 68
- Published applications
- 51
- Assignees
- 51
- Inventors
- 165
- Latest grant
- 7 Jul 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 2 | 0 |
| 1995 | 0 | 0 |
| 1996 | 2 | 0 |
| 1997 | 2 | 0 |
| 1998 | 2 | 0 |
| 1999 | 4 | 0 |
| 2000 | 1 | 0 |
| 2001 | 4 | 2 |
| 2002 | 3 | 0 |
| 2003 | 0 | 0 |
| 2004 | 4 | 1 |
| 2005 | 1 | 2 |
| 2006 | 2 | 2 |
| 2007 | 2 | 3 |
| 2008 | 1 | 1 |
| 2009 | 1 | 2 |
| 2010 | 1 | 2 |
| 2011 | 0 | 1 |
| 2012 | 2 | 1 |
| 2013 | 2 | 3 |
| 2014 | 5 | 2 |
| 2015 | 2 | 3 |
| 2016 | 3 | 4 |
| 2017 | 2 | 4 |
| 2018 | 2 | 3 |
| 2019 | 3 | 0 |
| 2020 | 3 | 1 |
| 2021 | 2 | 6 |
| 2022 | 1 | 3 |
| 2023 | 1 | 1 |
| 2024 | 3 | 2 |
| 2025 | 3 | 2 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Tip-enhanced spectroscopy7 Jul 2026US 12,674,746 B2Postech Research and Business Development Foundation
- Hybrid near-field scanning microwave microscope18 Nov 2025US 12,474,369 B2Universidade De Aveiro
- Micro-optomechanical system and method for the production thereof22 Apr 2025US 12,282,040 B2Karlsruher Institut für Technologie
- Scattering-type scanning near-field optical microscopy with Akiyama piezo-probes11 Mar 2025US 12,247,998 B2The Research Foundation for The State University of New York
- Integrated III-V/silicon atomic force microscopy active optical probe27 Aug 2024US 12,072,351 B1Actoprobe LLC
- Hybrid near-field scanning microwave microscope28 Aug 2025US 2025/0271465 A1Universidade De Aveiro
- Method and apparatus for scattering-type scanning near-field optical microscopy (s-snom)27 Feb 2025US 2025/0067770 A1Humboldt-Universitaet zu Berlin
- Scattering-type scanning near-field optical microscopy with akiyama piezo-probes15 Aug 2024US 2024/0272196 A1The Research Foundation for The State University of New York
- Tip-enhanced spectroscopy11 Jul 2024US 2024/0230520 A1Postech Research and Business Development Foundation
- Scanning probe microscope (spm) tip29 Jun 2023US 2023/0204625 A1Next-Tip, S.L.
Most cited
By later US patents
- High resolution scanning raman microscope149US 6,002,471 ACalifornia Institute of Technology · 1999
- Near field scanning optical and force microscope including cantilever and optical waveguide136US 5,354,985 AStanford University · 1994
- Scanning microscope comprising force-sensing means and position-sensitive photodetector95US 5,254,854 AAT&T Bell Laboratories · 1993
- Optical waveguide probe and its manufacturing method74US 6,370,306 B1Seiko Instruments Inc. · 2002
- SPM cantilever and a method for manufacturing the same58US 5,883,387 AOlympus Optical Co., Ltd. · 1999