G01Q 60/08
Mfm [magnetic force microscopy] combined with afm [atomic force microscopy
Official title: MFM [Magnetic Force Microscopy] combined with AFM [Atomic Force Microscopy
G01Q60/08 (Mfm [magnetic force microscopy] combined with afm [atomic force microscopy) appears on 38 US grants and 27 published applications in this corpus.
Search patents in G01Q- Granted patents
- 38
- Published applications
- 27
- Assignees
- 32
- Inventors
- 88
- Latest grant
- 26 May 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 1 | 0 |
| 1995 | 2 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 2 | 0 |
| 2001 | 1 | 1 |
| 2002 | 1 | 1 |
| 2003 | 1 | 0 |
| 2004 | 0 | 0 |
| 2005 | 0 | 1 |
| 2006 | 0 | 1 |
| 2007 | 1 | 2 |
| 2008 | 3 | 1 |
| 2009 | 1 | 0 |
| 2010 | 3 | 0 |
| 2011 | 0 | 0 |
| 2012 | 0 | 1 |
| 2013 | 0 | 0 |
| 2014 | 2 | 3 |
| 2015 | 1 | 1 |
| 2016 | 1 | 3 |
| 2017 | 2 | 1 |
| 2018 | 2 | 1 |
| 2019 | 0 | 1 |
| 2020 | 1 | 2 |
| 2021 | 0 | 1 |
| 2022 | 1 | 2 |
| 2023 | 5 | 3 |
| 2024 | 1 | 1 |
| 2025 | 0 | 0 |
| 2026 | 1 | 0 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Method and apparatus for measuring magnetic field strength26 May 2026US 12,638,522 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Nanoscale scanning sensors17 Dec 2024US 12,169,209 B2President and Fellows of Harvard College
- Method for detecting mechanical and magnetic features with nanoscale resolution5 Dec 2023US 11,835,547 B2
- Nanoscale scanning sensors14 Nov 2023US 11,815,528 B2President and Fellows of Harvard College
- Method and apparatus for measuring magnetic field strength19 Sep 2023US 11,762,046 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Nanoscale scanning sensors8 Feb 2024US 2024/0044938 A1President and Fellows of Harvard College
- Method and apparatus for measuring magnetic field strength9 Nov 2023US 2023/0358829 A1Taiwan Semiconductor Manufacturing Company.Ltd
- Method for detecting mechanical and magnetic features with nanoscale resolution1 Jun 2023US 2023/0168275 A1National Cheng Kung University
- Magnetic distribution detection method16 Mar 2023US 2023/0078584 A1National Cheng Kung University
- Nanoscale scanning sensors29 Dec 2022US 2022/0413007 A1President and Fellows of Harvard College
Most cited
By later US patents
- Surface observing apparatus and method88US 5,436,448 AHitachi, Ltd. · 1995
- Magnetic force microscope61US 6,504,365 B2JEOL Ltd. · 2003
- Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit54US 5,260,567 ACanon Kabushiki Kaisha · 1993
- Spin microscope based on optically detected magnetic resonance48US 7,608,820 B1The United States of America as represented by the United States Department of Energy · 2009
- Integrated optical nanoscale probe measurement of electric fields from electric charges in electronic devices40US 9,778,329 B2Infinitum Solutions, Inc. · 2017