Spin microscope based on optically detected magnetic resonance
AssigneeThe United States of America as represented by the United States Department of Energy
InventorsGennady P. Berman, Boris M. Chernobrod
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Abstract
The invention relates to scanning magnetic microscope which has a photoluminescent nanoprobe implanted in the tip apex of an atomic force microscope (AFM), a scanning tunneling microscope (STM) or a near-field scanning optical microscope (NSOM) and exhibits optically detected magnetic resonance (ODMR) in the vicinity of unpaired electron spins or nuclear magnetic moments in the sample material. The described spin microscope has demonstrated nanoscale lateral resolution and single spin sensitivity for the AFM and STM embodiments.
Claims7
A scanning magnetic microscope comprising:
- an cantilevered optical fiber onto the free end of which is fixed a photoluminescent nanoprobe;
- a sample of dilute paramagnetic particles exhibiting electron spins which is closely positioned, in the range of tens of nanometers, to said nanoprobe;
- a permanent magnet placed nearby for inducing an external magnetic field upon said nanoprobe and sample of dilute paramagnetic particles;
- a radio frequency coil placed nearby for inducing an external radio frequency field upon said nanoprobe and said sample of dilute paramagnetic particles;
- said cantilevered optical fiber introducing an evanescent laser exciting light upon said fixed nanoprobe at a frequency resonant with the transition between the magnetic sublevels of said nanoprobe;
- and
- a detector, positioned at a 45 degree angle to said nanoprobe and said sample of dilute paramagnetic particles in both plan and elevation views, capable of optically recognizing the photoluminescent intensity of transition emissions given off by said nanoprobe when excited.
Dependencies are inferred from the claim text.