Multi-probe atomic force microscopy rotator

Abstract

Systems and methods for providing a plurality of atomic force microscopy (AFM) probes are disclosed. An exemplary system includes a rotator configured to rotate about an axis. A plurality of AFM probes are disposed on a periphery of the rotator. The plurality of AFM probes may include one or more pluralities of AFM probes that are substantially analogous to one another or that are substantially different from one another. The rotator may be configured to rotate the AFM probes to a specified angle such that a first probe of the plurality of probes overlaps with a sample disposed on a sample holder. The sample holder is configured to translate the sample in three dimensions such that the sample interfaces with the first probe. The first probe is used to map the surface of the sample.

Dependencies are inferred from the claim text.