Device for imaging and electrochemical sensing

A mounting device comprising:

• a first portion configured to receive an atomic-force microscope (AFM) probe, wherein the AFM probe comprises a tuning fork comprising two prongs;
• a second portion configured to receive a micro or nano-sized reservoir;
• and
• the first and the second portions are aligned with each other such that when the tuning fork is mounted within the first portion, and the micro or nano-sized reservoir is mounted within the second portion, the micro or nano-sized reservoir is positioned substantially vertically to a distal end of one of the two prongs of the tuning fork.

A device comprising:

• a piezoelectric resonator;
• and
• a micro or nano-sized reservoir coupled to at least a portion of the piezoelectric resonator and having a predetermined length and comprising a body having a predetermined volume and extending into a tip, wherein the tip defines a distal portion of the reservoir and has a predetermined aperture diameter,
• wherein the predetermined length is measured from a coupling point to the piezoelectric resonator,
• wherein at least a portion of an interior portion of the body of the micro or nano-sized reservoir and/or at least a portion of an interior portion of the tip comprises a conductive material;
• wherein the body of the micro- or nano-sized reservoir comprises an electrode;
• wherein the predetermined length is selected to provide a Q-factor of the piezoelectric resonator of 500 Hz to 10 KHz;
• wherein a distance from the tip to the substrate surface is controlled by the piezoelectric resonator;
• and
• wherein the device is operated in a shear force mode, tapping mode, or a combination thereof.