G01Q 60/50
Mfm [magnetic force microscopy] or apparatus therefor
Official title: MFM [Magnetic Force Microscopy] or apparatus therefor, e.g. MFM probes
G01Q60/50 (Mfm [magnetic force microscopy] or apparatus therefor) appears on 138 US grants and 110 published applications in this corpus.
Search patents in G01Q- Granted patents
- 138
- Published applications
- 110
- Assignees
- 101
- Inventors
- 341
- Latest grant
- 9 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1989 | 1 | 0 |
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 4 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 3 | 0 |
| 1998 | 0 | 0 |
| 1999 | 4 | 0 |
| 2000 | 5 | 0 |
| 2001 | 3 | 1 |
| 2002 | 7 | 5 |
| 2003 | 7 | 10 |
| 2004 | 8 | 8 |
| 2005 | 6 | 8 |
| 2006 | 10 | 9 |
| 2007 | 8 | 5 |
| 2008 | 4 | 4 |
| 2009 | 5 | 1 |
| 2010 | 4 | 7 |
| 2011 | 2 | 3 |
| 2012 | 3 | 6 |
| 2013 | 8 | 9 |
| 2014 | 6 | 4 |
| 2015 | 4 | 2 |
| 2016 | 2 | 2 |
| 2017 | 3 | 3 |
| 2018 | 2 | 3 |
| 2019 | 2 | 3 |
| 2020 | 6 | 2 |
| 2021 | 2 | 2 |
| 2022 | 2 | 4 |
| 2023 | 5 | 4 |
| 2024 | 1 | 3 |
| 2025 | 1 | 0 |
| 2026 | 2 | 2 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Scanning probe microscope9 Jun 2026US 12,650,585 B2Hitachi, Ltd.
- Method and apparatus for measuring magnetic field strength26 May 2026US 12,638,522 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Magnetoresistive stack without radiated field, sensor and magnetic mapping system comprising such a stack8 Apr 2025US 12,274,177 B2Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Nanoscale scanning sensors17 Dec 2024US 12,169,209 B2President and Fellows of Harvard College
- Method for detecting mechanical and magnetic features with nanoscale resolution5 Dec 2023US 11,835,547 B2
- Mechanically mediated quantum systems9 Jul 2026US 2026/0195629 A1President and Fellows of Harvard College
- Cantilevered scanning probe quantum sensor and applications of the same26 Mar 2026US 2026/0086111 A1University of Maryland, College Park
- Metrology device and method12 Dec 2024US 2024/0410962 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Scanning probe microscope18 Apr 2024US 2024/0126061 A1Hitachi, Ltd.
- Nanoscale scanning sensors8 Feb 2024US 2024/0044938 A1President and Fellows of Harvard College
Most cited
By later US patents
- Microscopic tips having stable magnetic moments and disposed on cantilevers for sensing magnetic characteristics of adjacent structures150US 6,448,765 B1Read-Rite Corporation · 2002
- Nanometer scale probe for an atomic force microscope, and method for making same65US 5,171,992 AInternational Business Machines Corporation · 1992
- Spin microscope based on optically detected magnetic resonance65US 7,305,869 B1U. S. Department of Energy · 2007
- Method of manufacturing micro-tip for detecting tunneling current or micro-force or magnetic force61US 5,923,637 ACanon Kabushiki Kaisha · 1999
- Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit54US 5,260,567 ACanon Kabushiki Kaisha · 1993