G01Q 60/54
Probes, their manufacture, or their related instrumentation
Official title: Probes, their manufacture, or their related instrumentation, e.g. holders
G01Q60/54 (Probes, their manufacture, or their related instrumentation) appears on 91 US grants and 74 published applications in this corpus.
Search patents in G01Q- Granted patents
- 91
- Published applications
- 74
- Assignees
- 75
- Inventors
- 246
- Latest grant
- 8 Apr 2025
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1990 | 1 | 0 |
| 1991 | 1 | 0 |
| 1992 | 2 | 0 |
| 1993 | 3 | 0 |
| 1994 | 2 | 0 |
| 1995 | 1 | 0 |
| 1996 | 1 | 0 |
| 1997 | 2 | 0 |
| 1998 | 0 | 0 |
| 1999 | 3 | 0 |
| 2000 | 5 | 0 |
| 2001 | 2 | 0 |
| 2002 | 5 | 4 |
| 2003 | 6 | 9 |
| 2004 | 6 | 5 |
| 2005 | 4 | 8 |
| 2006 | 8 | 5 |
| 2007 | 3 | 4 |
| 2008 | 3 | 3 |
| 2009 | 3 | 0 |
| 2010 | 2 | 5 |
| 2011 | 1 | 2 |
| 2012 | 2 | 5 |
| 2013 | 5 | 5 |
| 2014 | 5 | 3 |
| 2015 | 2 | 2 |
| 2016 | 1 | 1 |
| 2017 | 1 | 2 |
| 2018 | 2 | 2 |
| 2019 | 2 | 0 |
| 2020 | 0 | 0 |
| 2021 | 1 | 0 |
| 2022 | 1 | 4 |
| 2023 | 3 | 2 |
| 2024 | 1 | 2 |
| 2025 | 1 | 0 |
| 2026 | 0 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Subgroups
Granted patents
Recent patents
- Magnetoresistive stack without radiated field, sensor and magnetic mapping system comprising such a stack8 Apr 2025US 12,274,177 B2Commissariat A L' Energie Atomique Et Aux Energies Alternatives
- Nanoscale scanning sensors17 Dec 2024US 12,169,209 B2President and Fellows of Harvard College
- Method for detecting mechanical and magnetic features with nanoscale resolution5 Dec 2023US 11,835,547 B2
- Nanoscale scanning sensors14 Nov 2023US 11,815,528 B2President and Fellows of Harvard College
- Method and apparatus for aligning a probe for scanning probe microscopy to the tip of a pointed sample10 Jan 2023US 11,549,963 B2Imec Vzw
- Cantilevered scanning probe quantum sensor and applications of the same26 Mar 2026US 2026/0086111 A1University of Maryland, College Park
- Metrology device and method12 Dec 2024US 2024/0410962 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Nanoscale scanning sensors8 Feb 2024US 2024/0044938 A1President and Fellows of Harvard College
- Method for detecting mechanical and magnetic features with nanoscale resolution1 Jun 2023US 2023/0168275 A1National Cheng Kung University
- A diamond scanning element, especially for imaging application, and a method for its fabrication13 Apr 2023US 2023/0113008 A1UniversitäT Basel
Most cited
By later US patents
- Microscopic tips having stable magnetic moments and disposed on cantilevers for sensing magnetic characteristics of adjacent structures150US 6,448,765 B1Read-Rite Corporation · 2002
- Nanometer scale probe for an atomic force microscope, and method for making same65US 5,171,992 AInternational Business Machines Corporation · 1992
- Method of manufacturing micro-tip for detecting tunneling current or micro-force or magnetic force61US 5,923,637 ACanon Kabushiki Kaisha · 1999
- Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit54US 5,260,567 ACanon Kabushiki Kaisha · 1993
- Fusion-welded nanotube surface signal probe and method of attaching nanotube to probe holder43US 6,528,785 B1Daiken Chemical Co., Ltd. · 2003