G01Q 60/56
Probes with magnetic coating
G01Q60/56 (Probes with magnetic coating) appears on 32 US grants and 20 published applications in this corpus.
Search patents in G01Q- Granted patents
- 32
- Published applications
- 20
- Assignees
- 30
- Inventors
- 102
- Latest grant
- 12 Feb 2019
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1991 | 1 | 0 |
| 1992 | 0 | 0 |
| 1993 | 2 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 2 | 0 |
| 2000 | 3 | 0 |
| 2001 | 1 | 0 |
| 2002 | 3 | 0 |
| 2003 | 0 | 1 |
| 2004 | 1 | 0 |
| 2005 | 1 | 2 |
| 2006 | 0 | 2 |
| 2007 | 0 | 0 |
| 2008 | 1 | 3 |
| 2009 | 2 | 0 |
| 2010 | 1 | 4 |
| 2011 | 1 | 0 |
| 2012 | 1 | 2 |
| 2013 | 3 | 2 |
| 2014 | 4 | 2 |
| 2015 | 1 | 0 |
| 2016 | 1 | 1 |
| 2017 | 1 | 0 |
| 2018 | 0 | 1 |
| 2019 | 1 | 0 |
By publication year. Applications have been published since 2001.
Recent patents
- Cantilever for a scanning type probe microscope12 Feb 2019US 10,203,354 B2National University Corporation Nagoya Institute of Technology
- Scanning probe sensor with a ferromagnetic fluid14 Feb 2017US 9,568,496 B1International Business Machines Corporation
- Magnetic field value measuring device and method for measuring magnetic field value1 Nov 2016US 9,482,692 B2Akita University
- Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source21 Apr 2015US 9,015,861 B2Consejo Superior De Investigaciones Cientificas (Csic)
- Magnetic force microscope and magnetic field observation method using same16 Dec 2014US 8,912,789 B2Hitachi, Ltd.
- Cantilever17 May 2018US 2018/0136253 A1National University Corporation Nagoya Institute o f Technology
- Magnetic field value measuring device and method for measuring magnetic field value21 Apr 2016US 2016/0109478 A1Akita University
- Method and apparatus for inspecting thermal assist type magnetic head3 Apr 2014US 2014/0092716 A1Hitachi High-Technologies Corporation
- Method and apparatus for inspecting thermal assist type magnetic head3 Apr 2014US 2014/0096293 A1Hitachi High-Technologies Corporation
- Modification of atomic force microscopy tips by deposition of nanoparticles with an aggregate source2 May 2013US 2013/0111637 A1Consejo Superior De Investicaciones CientíFicas (Csic)
Most cited
By later US patents
- Microscopic tips having stable magnetic moments and disposed on cantilevers for sensing magnetic characteristics of adjacent structures150US 6,448,765 B1Read-Rite Corporation · 2002
- Cantilever unit and atomic force microscope, magnetic force microscope, reproducing apparatus and information processing apparatus using the cantilever unit54US 5,260,567 ACanon Kabushiki Kaisha · 1993
- Methods for referencing related magnetic head microscopy scans to reduce processing requirements for high resolution imaging38US 8,490,211 B1Western Digital Technologies, Inc. · 2013
- Magnetic force microscopy probe with integrated coil34US 5,900,729 AInternational Business Machines Corporation · 1999
- Alternating current magnetic force microscopy system with probe having integrated coil27US 5,900,728 AInternational Business Machines Corporation · 1999