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US 2026/0086111 A1Published application
Cantilevered scanning probe quantum sensor and applications of the same
AssigneeUniversity of Maryland, College Park
InventorsHuayu Zhang, Min Ouyang
Life of this patent
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Abstract
Highly integrated cantilever-based probe employing apparatus configured for scanning-type quantum sensing and imaging of nitrogen-vacancy centers. Optionally, the apparatus may utilize an atomic force microscope hardware. Method for fabricating and operating the same. The as-fabricated cantilever-based probe for use with such apparatus is structured to operate as a microwave antenna and lends itself for various magnetic field imaging, electric field imaging, and thermal imaging with high detection sensitivity and nano-scale spatial resolution.
Claims22
An article of manufacture comprising:
- a cantilevered probe having a cantilever and a tip at a proximal end thereof, the cantilevered probe structured to operate as a microwave antenna and configured to be operably connected to a microwave generator system.
A method comprising:
- with a cantilevered probe of a scanning force microscope, which probe has been configured to operate as a microwave antenna:
- emitting an electromagnetic wave;
- and
- characterizing a piece of a diamond material and/or manipulating a physical characteristic of the piece of the diamond material with the use of said electromagnetic wave.
1 more element
Dependencies are inferred from the claim text.