G01Q 60/52
Resonance
G01Q60/52 (Resonance) appears on 36 US grants and 31 published applications in this corpus.
Search patents in G01Q- Granted patents
- 36
- Published applications
- 31
- Assignees
- 27
- Inventors
- 74
- Latest grant
- 9 Jun 2026
Filings by year
| Year | Granted patents | Published applications |
|---|---|---|
| 1993 | 1 | 0 |
| 1994 | 0 | 0 |
| 1995 | 0 | 0 |
| 1996 | 0 | 0 |
| 1997 | 1 | 0 |
| 1998 | 0 | 0 |
| 1999 | 1 | 0 |
| 2000 | 0 | 0 |
| 2001 | 1 | 0 |
| 2002 | 0 | 0 |
| 2003 | 0 | 0 |
| 2004 | 2 | 2 |
| 2005 | 1 | 1 |
| 2006 | 0 | 1 |
| 2007 | 3 | 2 |
| 2008 | 2 | 1 |
| 2009 | 2 | 1 |
| 2010 | 2 | 1 |
| 2011 | 1 | 0 |
| 2012 | 1 | 1 |
| 2013 | 1 | 4 |
| 2014 | 1 | 1 |
| 2015 | 2 | 1 |
| 2016 | 1 | 1 |
| 2017 | 2 | 1 |
| 2018 | 1 | 2 |
| 2019 | 0 | 2 |
| 2020 | 4 | 2 |
| 2021 | 0 | 1 |
| 2022 | 1 | 1 |
| 2023 | 2 | 1 |
| 2024 | 1 | 3 |
| 2025 | 0 | 0 |
| 2026 | 2 | 1 |
By publication year. Applications have been published since 2001. 2026 runs to 8 Oct.
Recent patents
- Scanning probe microscope9 Jun 2026US 12,650,585 B2Hitachi, Ltd.
- Method and apparatus for measuring magnetic field strength26 May 2026US 12,638,522 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Nanoscale scanning sensors17 Dec 2024US 12,169,209 B2President and Fellows of Harvard College
- Nanoscale scanning sensors14 Nov 2023US 11,815,528 B2President and Fellows of Harvard College
- Method and apparatus for measuring magnetic field strength19 Sep 2023US 11,762,046 B2Taiwan Semiconductor Manufacturing Company.Ltd
- Mechanically mediated quantum systems9 Jul 2026US 2026/0195629 A1President and Fellows of Harvard College
- Metrology device and method12 Dec 2024US 2024/0410962 A1Nederlandse Organisatie voor toegepast-natuurwetenschappelijk onderzoek TNO
- Scanning probe microscope18 Apr 2024US 2024/0126061 A1Hitachi, Ltd.
- Nanoscale scanning sensors8 Feb 2024US 2024/0044938 A1President and Fellows of Harvard College
- Method and apparatus for measuring magnetic field strength9 Nov 2023US 2023/0358829 A1Taiwan Semiconductor Manufacturing Company.Ltd
Most cited
By later US patents
- Spin microscope based on optically detected magnetic resonance65US 7,305,869 B1U. S. Department of Energy · 2007
- Spin microscope based on optically detected magnetic resonance48US 7,608,820 B1The United States of America as represented by the United States Department of Energy · 2009
- Mechanical detection and imaging of magnetic resonance by magnetic moment modulation38US 5,266,896 AInternational Business Machines Corporation · 1993
- Magnetic resonance method and apparatus for detecting an atomic structure of a sample along a surface thereof31US 5,619,139 ABruker Analytische Messtechnik GmbH · 1997
- Nanotube cantilever probes for nanoscale magnetic microscopy22US 6,887,365 B2The Trustees of Boston College · 2005